JUNE 19-21, 2023

Materials Characterization & Imaging

Nanoscale Materials Characterization

Symposium Co-Chairs

Greg HaugstadGreg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota

Dalia YablonDalia Yablon
Technical Program Chair
TechConnect World Innovation Conference

Alex NormanAlex Norman
Executive Director
Princeton Institute of Materials

2022 Key Speakers

Igor SokolovMachine learning for recognition and classification of AFM images
Igor Sokolov
Professor, Tufts University

Jerry HunterEffect of user fees on core facility income and user behavior: It’s not what you think
Jerry Hunter
Director, Wisconsin Centers for Nanoscale Technology

Babak EslamiEnhancing or Diminishing Sensitivity in Multifrequency AFM
Babak Eslami
Assistant Professor, Widener University

Arzu ColakFriction Property of Ti3C2Tx MXene at the Nanoscale
Arzu Colak
Research Assistant Professor, Clarkson University

Jason KillgoreQuantitative Piezoresponse Force Microscopy for Every User
Jason Killgore
Project Leader, National Institute of Standards and Technology

Liang GongNanoscale Materials Analysis using AFM-IR
Liang Gong
Senior Research Scientist, 3M

Nan YaoImaging and analysis - an engine for the discovery and innovation
Nan Yao
Professor & Founding Director, Princeton University Imaging and Analysis Center

Jacob JonesThe North Carolina Research Triangle Nanotechnology Network (RTNN)
Jacob Jones
Professor, North Carolina State University

Christopher SimsComparison Analysis of 2D Nanomaterial Dispersions using Analytical Ultracentrifugation and Microscopy Methods
Christopher Sims
Research Chemist, National Institute of Standards and Technology

Jason KillgoreQuantitative Piezoresponse Force Microscopy for Every User
Jason Killgore
Project Leader, NIST

This year's symposium will focus on innovations in nanoscale materials characterization including new method development as well as industry-specific applications. Submissions are also invited for special sessions focused on machine learning for materials characterization and imaging (in conjunction with the AI TechConnect Conference); and on industrial applications of x-ray scattering methods.

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2023 Symposium Sessions

Tuesday June 20

4:00Materials Characterization - Posters

Wednesday June 21

9:00Materials Characterization

2023 Symposium Program

Tuesday June 20

4:00Materials Characterization - PostersExpo Hall AB
A Powerful New Tool for Rapid Chemical Characterization of Advanced Manufacturing Materials
E. Williams, J. Putman, P. Willis, Exum Instruments, US
Versatile thin film adhesion and scratch testing machine for different material surfaces under various environmental condition
W. Demisse, P. Tyagi, University of the District of Columbia, US
A Decade Team Work in Pursuing Discoveries in Nanostructure Membrane Characterizations and Observations of Friedel-oscillation by AFM for Quantum Sensing and Energy Storage Applications
J. Thornton, E.T. Chen, Advanced Biomimetic Sensors, Inc., US
Democratizing the Assessment of Thermal Robustness of Metal-Organic Frameworks
S. Bonakala, A. Abutaha, E. Palani, A. Samara, S. Mansour, F. El-Mellouhi, Hamad Bin Khalifa University, QA
Chemical identification & characterization of sub-20nm residues and defects with Nano IR PiFM
P. O'Hara, Molecular Vista, Inc., US
High Resolution Measurement of Potential-Dependent Electrochemical Activities on HOPG Using Scanning Electrochemical Cell Microscopy (SECCM)
M-H. Choi, S-J. Cho, L.A. Baker, S. Kaemmer, Park Systems inc., US
Princeton Collaborative Research Facility: diagnostics and modeling for plasma material synthesis and processing applications
Y. Raitses, I. Kaganovich, M. Shneider, A. Dogariu, S. Yatom, S. Gershman, I. Romadanov, N. Chopra, W. Villafana, Y. Ussenov, S. Abe, Princeton Plasma Physics Laboratory, US
Wyonics: Advancing Sustainable Innovations in Wyoming
D. Rone, J. O'Hayre, R.D. Rogers, G. Gurau, C.M. Hill, K.R. Di Bona, Wyonics, US
Broadband Plasmonic SEIRA Structures for Signal Enhancement in nanoIR Spectroscopy
G. Rutins, L. Tetard, University of Central Florida, US

Wednesday June 21

9:00Materials CharacterizationChesapeake A
Session chair: Alex Norman, Princeton University, US
9:00Quantifying Adsorbed Dispersant Layers on Single-Wall Carbon Nanotubes in Simple and Complex Environments
C.M. Sims, J.A. Fagan, National Institute of Standards and Technology, US
9:20Infrared CT Scan for Evaluating the Stress Response of Flexible Displays
J. Isbell, Materic, US
9:40A versatile direct optical characterization method for morphology changes and swelling kinetics of smart hydrogels
G. Mu, J. Koerner, Leibniz University Hannover, DE
10:00MultiModal Domain Intelligent Decision Support
G. Olson, GT Digital Ltd., US
10:30RippleGo - First AI-Based Voyage Planner for the Inland Waterways
A.R. Salindong, Trabus Technologies, US
10:50Using Physics-Informed Machine Learning to Collect Road Conditions with Connected Vehicles
N. Kargah-Ostadi, Callentis Consulting Group, US
11:10Detecting Engine Oil Defects From Images of Vehicle Components
A.K. Devarashetti, L. Forte III, W. Giegerich, Ph.J. Schneider, ACV Auctions, US
11:30AI for cell culture monitoring in the closed loop
R. Krampl, A. Trcka, BioX Technologies, SK
Topics & Application Areas
  • User facilities for industrial participation
  • Advances in image analysis
  • Characterization of real-world systems
  • Machine learning for Characterization
  • Other

Sponsor & Exhibitor Opportunities

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Sponsors & Partners
SBIR/STTR Agency Partners