JUNE 19-21, 2023

Materials Characterization & Imaging

Nanoscale Materials Characterization

Submit your Poster Only Abstract - due March 31

Please first review the information for authors — abstract submission guidelines.

Symposium Co-Chairs

Greg HaugstadGreg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota

Dalia YablonDalia Yablon
Technical Program Chair
TechConnect World Innovation Conference

Alex NormanAlex Norman
Executive Director
Princeton Institute of Materials

2022 Key Speakers

Igor SokolovMachine learning for recognition and classification of AFM images
Igor Sokolov
Professor, Tufts University

Jerry HunterEffect of user fees on core facility income and user behavior: It’s not what you think
Jerry Hunter
Director, Wisconsin Centers for Nanoscale Technology

Babak EslamiEnhancing or Diminishing Sensitivity in Multifrequency AFM
Babak Eslami
Assistant Professor, Widener University

Arzu ColakFriction Property of Ti3C2Tx MXene at the Nanoscale
Arzu Colak
Research Assistant Professor, Clarkson University

Jason KillgoreQuantitative Piezoresponse Force Microscopy for Every User
Jason Killgore
Project Leader, National Institute of Standards and Technology

Liang GongNanoscale Materials Analysis using AFM-IR
Liang Gong
Senior Research Scientist, 3M

Nan YaoImaging and analysis - an engine for the discovery and innovation
Nan Yao
Professor & Founding Director, Princeton University Imaging and Analysis Center

Jacob JonesThe North Carolina Research Triangle Nanotechnology Network (RTNN)
Jacob Jones
Professor, North Carolina State University

Christopher SimsComparison Analysis of 2D Nanomaterial Dispersions using Analytical Ultracentrifugation and Microscopy Methods
Christopher Sims
Research Chemist, National Institute of Standards and Technology

Jason KillgoreQuantitative Piezoresponse Force Microscopy for Every User
Jason Killgore
Project Leader, NIST

This year's symposium will focus on innovations in nanoscale materials characterization including new method development as well as industry-specific applications. Submissions are also invited for special sessions focused on machine learning for materials characterization and imaging (in conjunction with the AI TechConnect Conference); and on industrial applications of x-ray scattering methods.

Topics & Application Areas
  • User facilities for industrial participation
  • Advances in image analysis
  • Characterization of real-world systems
  • Machine learning for Characterization
  • Other

Sponsor & Exhibitor Opportunities

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Sponsors & Partners
SBIR/STTR Agency Partners