SPMConnect is launching at TechConnect 2023 as an annual AFM-based conference to foster and support the AFM community in terms of idea exchange, best practices development, mentoring, and career development. In addition to research talks, in line with the industrial/innovation theme of the broader TCW meeting, SPMConnect will feature panel discussions and plenty of opportunities for AFM researchers and scientists to meet, network and exchange ideas.
This conference aims to bring together users from a wide variety of disciplines including polymer science, biology, energy, computing, materials science, and more who share an interest in SPM as an instrument to explore nanoscale phenomena and characterization. SPMConnect aims to include scientists and researchers from a wide variety of backgrounds including industry, instrumentation vendors, academia, and national labs. Technical abstracts for both oral and poster presentation are welcomed with topics for 2023 SPMConnect listed below.
Back to Top ↑2023 Symposium Sessions |
| 9:00 | SPM: Dynamic Processes at Solid-liquid Interfaces |
| 10:40 | SPM: Dynamic AFM |
| 1:30 | SPM: Machine Learning & Automation |
| 3:30 | SPM User Facilities Leadership Panel |
| Tuesday June 20 |
| 10:30 | SPM Based Chemical Spectroscopy |
| 1:30 | SPM in Biology & Medicine |
| Wednesday June 21 |
| 9:00 | SPM: Nanomechanics & Tribology |
| 1:30 | SPM: Voltage Modulated SPM Modes |
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2023 Symposium Program |
| Monday June 19 |
|
| 9:00 | SPM: Dynamic Processes at Solid-liquid Interfaces | TBA |
| Session chair: Liam Collins, Oak Ridge National Laboratory, US |
| In situ and Operando Force-based Atomic Force Microscopy For Probing Local Functionality in Energy Storage Materials
N. Balke, North Carolina State University, US |
| Scanning Electrochemical Probe Microscopy Reveals Tunable Angle-dependent Electrochemistry at Twisted Bilayer Graphene
Y. Yu, K. Zhang, D. Kwabena Bediako, George Mason University, US |
| Mapping electrical double layer structure over nanostructured surfaces with three-dimensional atomic force microscopy.
B.A. Legg, M. Zhang, J. Heo, E. Nakouzi, J.J. De Yoreo, Pacific Northwest National Laboratory, US |
| Faster and gentler: new scan algorithms and probes for AFM
P. Ashby, Lawrence Berkeley National Laboratory, US |
|
| 10:40 | SPM: Dynamic AFM | TBA |
| Session chair: Liam Collins, Oak Ridge National Laboratory, US |
| The effects of beam dynamics on Atomic Force Microscopy measurements
R. Wagner, Purdue University, US |
| Development of an automated sample preparation process for polymer blend morphology by AFM
C. Reinhardt, G. Meyers, Dow Inc., US |
| Photothermally driven AFM of soft matter samples
P. van Schendel, P. Frederix, H. Gunstheimer, E. Nelson, D. Ziegler, C. Bippes, J. Adams, Nanosurf, CH |
| Low Frequency Photothermal Excitation of AFM Microcantilevers
A. Deolia, A. Raman, R.B. Wagner, Purdue University, US |
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| 1:30 | SPM: Machine Learning & Automation | TBA |
| Session chair: Greg Haugstad, University of Minnesota, US |
| Real-Time Physics-Constrained Machine Learning in Multidimensional Atomic Force Microscopy
J.C. Agar, Drexel University, US |
| A deep learning content-based image retrieval tool for AFM topography maps
B. Rajabifar, 3M, US |
| Automated and autonomous scanning probe microscopy for understanding and controlling dynamics in ferroelectric materials
R. Vasudevan, B. Smith, A. Khojandi, S.M. Valleti, S. Jesse, Y. Liu, S.V. Kalinin, M. Ziatdinov, Oak Ridge National Laboratory, US |
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| 3:30 | SPM User Facilities Leadership Panel | TBA |
| Session chair: G. Haugstad, University of Minnesota, US |
| Managing an SPM Shared User Facility at MIT
A. Schwartzman, Massachusetts Institute of Technology, US |
| Panelist
C. Newcomb, Stanford University, US |
| Panelist
J. Tresback, Harvard University, US |
| Panelist
L. Collins, Oak Ridge National Laboratory, US |
| Tuesday June 20 |
|
| 10:30 | SPM Based Chemical Spectroscopy | TBA |
| Session chair: Liang Gong, 3M, US |
| Exploiting infrared light-matter interactions to explore complex systems at the nanoscale
L. Tetard, University of Central Florida, US |
| Single electron spectroscopy and ultrafast time resolution by AFM
P. Grutter, McGill University, CA |
| Elucidation of silk fiber formation by multi-modal SPM
S. Cohen, Weizmann Institute of Science, IL |
| Infrared correlation nanoscopy with unprecedented spectral coverage
T. Gokus, attocube Systems AG, DE |
| Correlative Nanoscale Topographical, Mechanical, Electrical and Chemical Property Mapping with Dimension IconIR
C. Li, C. Phillips, Bruker Nano Surfaces and Metrology, US |
|
| 1:30 | SPM in Biology & Medicine | TBA |
| Multiplexed nanoscale viscoelastic mapping of melanoma cells as a biomarker of tumor progression and metastasis
A. Cartagena-Rivera, National Institutes of Health (NIH), US |
| Malaria derived-EVs properties and function studied by Atomic force microscopy (AFM)
I. Rosenhek-Goldian, P.A. Karam, I. Azuri, E. Dekel, M.I. Morandi, S.R. Cohen, N. Regev-Rudzki, Weizmann Institute of Science, IL |
| Evaluation of FluidFM for genome editing in single cells
S. Patange, S. Maragh, U.S. National Institute of Standards and Technology, US |
| The Effect of Lipid Bilayer Dehydration on its Physical Properties
N. Kampf, Y. Dong, Y. Schilt, W. Cao, U. Raviv, J. Klein, Weizmann Institute of Science, IL |
| Elucidating the pH-driven conformational shift of R-bodies, a force generator in bacteria, with in situ AFM
S. Zhang, University of Washington, US |
| Designed Interfaces Between Proteins and Inorganic Crystals for Templated Assembly and Co-Assembly
S. Yadav, A. Stegmann, B. Helfrecht, H. Pyles, C. Mundy, S. Zhang, D. Baker, J. de Yoreo, Pacific Northwest National Laboratory, US |
| Wednesday June 21 |
|
| 9:00 | SPM: Nanomechanics & Tribology | TBA |
| Contact Resonance AFM using Long, Massive, Flexible Tips
R.C. Tung, N. Zimron-Politi, University of Nevada, Reno, US |
| In Situ Study of the Pressure-Dependent Lubrication Mechanism of Phosphonium Phosphate Ionic Liquid in Nanoscale Single-Asperity Sliding Contacts
Z. Li, O. Morales-Collazo, J.T. Sadowski, H. Celio, A. Dolocan, J.F. Brennecke, F. Mangolini, The University of Texas at Austin, US |
| Improved Contact Resonance Atomic Force Microscopy Data Analysis Techniques
N. Zimron-Politi, R.C. Tung, University of Nevada, Reno, US |
| The influence of nanoscale mechanical property distribution on macroscopic performance of polymer composites
B. Pittenger, S. Osechinskiy, J. Thornton, S. Loire, T. Mueller, Bruker, US |
| Maximizing information extraction from AFM nanoindentation — Best practices to algorithms
R. Sheridan, C. Brinson, Duke University, US |
| Force Spectroscopy Measurements with a focus on viscoelasticity and elasticity of SiO2 nanoparticles on etched biotite and muscovite surfaces
S.S.S. Uygan, D. Yablon, C. Kielar, E. Vogelsberg, D. Erb, P. Müller, T. Heine, K. Monakhov, B. Abel, C. Fischer, Leibniz Institute of Polymer Research, DE |
| Traceability of NIST Reference Cantilever Array for Standard Reference Material 3461
G.A. Shaw, R.S. Gates, W.A. Osborn, M.J. McLean, J.J. Filliben, National Institute of Standards and Technology, US |
| Strengthening Polylactic Acid by Salification: Surface Characterization Study
J. Schlosser, K. Fouladi, B. Eslami, Widener University, US |
|
| 1:30 | SPM: Voltage Modulated SPM Modes | TBA |
| Using electrostatic force microscopy to investigate localized charges on single-walled carbon nanotubes
E. Christensen, T. Tumiel, M. Amin, T. Krauss, University of Rochester, US |
| High speed imaging of surface charge dynamics via Spiral Scanning KPFM and Gaussian Process inpainting
M. Checa, Oak Ridge National Laboratory, US |
| Measurement sensitivity in electrostatic force and force gradient microscopy-based modes
G. Stan, National Institute of Standards and Technology, US |
| Measuring Dynamics in Energy Materials with Time-Resolved Atomic Force Microscopy
R. Giridharagopal, M.D. Breshears, D.S. Ginger, University of Washington, US |
| Quantitative Piezoresponse Force Microscopy for Process Optimization of Scandium-doped Aluminum Nitride in Acoustic Resonator RF Filters
B. Ohler, F.T. Limpoco, R. Proksch, Oxford Instruments Asylum Research Inc, US |
| Exploring Sub-Coercive Field Domain Wall Motion Dynamics with Piezo Response Scanning Oscillator Microscopy
S. Raghuraman, K. Kelley, S. Jesse, Oak Ridge National Laboratory, US |
| Effect of humidity and temperature on piezoresponse of single phase multiferroic thin films
D.K. Pradhan, The University of Tennessee, Knoxville TN 37996, USA and Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA, US |
|
Greg Haugstad
Faster and gentler: new scan algorithms and probes for AFM
In situ and Operando Force-based Atomic Force Microscopy For Probing Local Functionality in Energy Storage Materials
Multiplexed nanoscale viscoelastic mapping of melanoma cells as a biomarker of tumor progression and metastasis
Single electron spectroscopy and ultrafast time resolution by AFM
The effects of beam dynamics on Atomic Force Microscopy measurements
Exploiting infrared light-matter interactions to explore complex systems at the nanoscale
In Situ Study of the Pressure-Dependent Lubrication Mechanism of Phosphonium Phosphate Ionic Liquid in Nanoscale Single-Asperity Sliding Contacts
Real-Time Physics-Constrained Machine Learning in Multidimensional Atomic Force Microscopy
A deep learning content-based image retrieval tool for AFM topography maps
Contact Resonance AFM using Long, Massive, Flexible Tips
Development of an automated sample preparation process for polymer blend morphology by AFM
Evaluation of FluidFM for genome editing in single cells
Managing an SPM Shared User Facility at MIT
