JUNE 9-11, 2025 | AUSTIN, TX
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  SMPConnect  


About SPMConnect

SPMConnect is an annual AFM-based conference to foster and support the AFM community in terms of idea exchange, best practices development, mentoring, and career development. In addition to research talks, in line with the industrial/innovation theme of the broader TCW meeting, SPMConnect will feature panel discussions and plenty of opportunities for AFM researchers and scientists to meet, network and exchange ideas.

This conference aims to bring together users from a wide variety of disciplines including polymer science, biology, energy, computing, materials science, and more who share an interest in SPM as an instrument to explore nanoscale phenomena and characterization. SPMConnect aims to include scientists and researchers from a wide variety of backgrounds including industry, instrumentation vendors, academia, and national labs. Technical abstracts for both oral and poster presentation are welcomed with topics for SPMConnect listed below.

Submit Abstract - due December 17 »

Please first review the information for authors — abstract submission guidelines.


Topics & Application Areas
  • Nanomechanical measurements on soft materials
  • SPM in biology and medicine
  • AI/ML methods for SPM measurement, acquisition, image processing
  • High speed/high resolution SPM
  • Multimodal SPM-based methods
  • Industrial / real world applications
  • SPM for Energy Applications
  • FluidFM
  • Other
 

Symposium Co-Chairs


Simona Patange

Simona Patange

Biologist

National Institute of Standards and Technology

Dalia Yablon

Dalia Yablon

Technical Program Chair

TechConnect World Innovation Conference


Filippo Mangolini

Filippo Mangolini

Associate Professor

UT Austin

Jinhui Tao

Jinhui Tao

Scientist

PNNL


2024 Key Speakers Included


Mehmet Baykara

Mehmet Baykara

Associate Professor,

University of California, Merced

James De Yoreo

James De Yoreo

Chief Scientist,

Pacific Northwest National Laboratory


Mihir Pendharkar

Mihir Pendharkar

Postdoctoral Fellow,

Stanford University

Daniël Melters

Daniël Melters

Staff Scientist,

National Cancer Institute


Angelo Gaitas

Angelo Gaitas

Assistant Professor,

Icahn School of Medicine at Mt. Sinai

Gang-yu Liu

Gang-yu Liu

Professor

University of California, Davis


Ozgur Sahin

Ozgur Sahin

Professor,

Columbia University


Amy Gelmi

Amy Gelmi

Senior Lecturer,

Royal Melbourne Institute of Technology, Australia

Georg Fantner

Georg Fantner

Associate Professor,

EPFL, Switzerland


Ilka Hermes

Ilka Hermes

Group Leader,

Liebniz Institute, Germany

Alex Eskandarian

Alex Eskandarian

Researcher,

Harvard Medical School



 
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2024 Symposium Sessions

Monday June 17

10:30SPMConnect: Novel uses of Cantilever Dynamics
1:30SPMConnect: Electrical Modes I (Electrostatics & Conductive)
3:30SPMConnect: Panel Discussion - SPM for Semiconductors

Tuesday June 18

9:00SPMConnect: Advances FluidFM
11:00SPMConnect: Dynamic Processes at Solid-Liquid Interfaces
1:30SPM Nanomechanics
3:30SPM Cantilevers
3:45Panel Discussion - SPM Cantilevers

Wednesday June 19

9:00SPMConnect: Chemical Spectroscopy
10:00Scanning Probe Microscopy of 2D Materials
1:30SPMConnect: SPM of Cells, Biomolecules & Biomaterials
3:00SPMConnect: Electrical modes II (Electromechanics)

2024 Symposium Program

Monday June 17

10:30SPMConnect: Novel uses of Cantilever DynamicsNational Harbor 5
Session chair: James De Yoreo, Pacific Northwest National Laboratory, US
AFM cantilever structure revisited – improving AFM imaging speed through unconventional cantilever design
G.E. Fantner, N. Hosseini, M. Neuenschwander, P. Swain, M. Penedo, EPFL, CH
Harnessing torsional resonances for enhanced atomic force microscopy
B. Pittenger, M. Ye, S. Hu, J. Thornton, P. De Wolf, Bruker Corporation, US
AFM cantilever, contact mechanics, and electrostatics calibration in the off-resonant dynamic regime
S. Raghuraman, N. Domingo, S. Jesse, Oak Ridge National Laboratory, US
1:30SPMConnect: Electrical Modes I (Electrostatics & Conductive)National Harbor 5
Session chair: Mihir Pendharkar, Stanford University, US
Atomic-Resolution Surface Imaging under Ambient Conditions via Conductive Atomic Force Microscopy
M.Z. Baykara, University of California, Merced, US
Tracking charge dynamics by high speed and time resolved Kelvin Probe Force Microscopy
S. Jesse, Oak Ridge National Laboratory, US
Measuring Microsecond Dynamics in Photovoltaics with Time-Resolved Electrostatic Force Microscopy
R. Giridharagopal, M.D. Breshears, J. Pothoof, D.S. Ginger, University of Washington, US
Spatially resolved random telegraph noise
P. Grutter, McGill University, CA
Optimized Cantilevers for Highly Sensitive and Spatially Resolved Measurements of Magnetic, Electric, and Dielectric Properties in Lift-Mode operated AFM Techniques
P. De Wolf, R. Poddar, K. Kaja, B. Pittenger, S. Hu, Bruker, US
3:30SPMConnect: Panel Discussion - SPM for SemiconductorsNational Harbor 5
Session chair: Jason Killgore, NIST, US
Panelist
G. Min, Park Instruments, US
Panelist
D. Ziegler, Nanosurf, US
Panelist
K. Amponsah, Xallent Inc., US

Tuesday June 18

9:00SPMConnect: Advances FluidFMNational Harbor 5
Session chair: Simona Patange, NIST, US
FluidFM: Cytosurge's journey from hollow AFM probes to precision genome engineering
P. Behr, Cytosurge AG, CH
FluidFM in Live Cell Biology: From Biomechanics to Single-Cell Omics
O. Guillaume-Gentil, EPFL, CH
Advancements in BioAFM: Fluid Micro Cantilevers and Novel Thermocouple Devices for Cellular Analysis
A. Gaitas, Icahn School of Medicine at Mt. Sinai, US
Capturing Transient Responses – Combining BioAFM with External Stimulation
A. Gelmi, RMIT University, AU
Scanning Probe Microscopy Based Investigations at Single Cell Level
G-Y. Liu, University of California, Davis, US
11:00SPMConnect: Dynamic Processes at Solid-Liquid InterfacesNational Harbor 5
Session chair: Christina Newcomb, Stanford University, US
An in situ look at interfacial structure and dynamics during nucleation and self-assembly
J.J. De Yoreo, Pacific Northwest National Laboratory, US
Scanning Probe Microscopy Investigations of Microbiologically Influenced Corrosion on Naval Assets
T.T. Brown, J.S. Lee, U.S. Naval Research Laboratory, US
The role of additives on the thermodynamics and kinetics of nucleation, crystal growth and dissolution
J. Tao, Pacific Northwest National Laboratory, US
1:30SPM NanomechanicsNational Harbor 5
Session chair: Jason Killgore, NIST, US
Nanomechanical analysis of materials using photothermal off-resonance actuation
E. Nelson, J.D. Adams, H. Gunstheimer, G. Fläschner, B. Hoogenboom, Nanosurf AG, CH
Broadband, High Frequency Viscoelastic Property Characterization of Polymers with Atomic Force Microscopy
A. Deolia, S.P. Carter, R.B. Wagner, Purdue University, US
Mechano-Spectroscopy of Soft Materials with Atomic Force Microscopy: Comparison with Raman Confocal Microscopy
N. Kulachenkov, M. Petrov, I. Sokolov, Tufts University, US
Pushing AFM to the boundaries — Validating mechanical property measurement near a rigid substrate
R.J. Sheridan, I. Saito, L.C. Brinson, Duke University, US
Advancing Nanobiomechanical Research: Large Tissue Area Mapping and Nano Scale Rheology via AFM
M. Ye, A. Koernig, Bruker Nano Surface, US
Exploring Biomechanical Properties of Microporous Annealed Particle Hydrogel (MAP Gel) in Comparison with MAP-treated Natural Tissues
M. Motezaker, J.J. Daniero, P.E. Hopkins, University of Virginia, US
3:30SPM CantileversNational Harbor 5
Session chair: Christina Newcomb, Stanford University, US
3:45Panel Discussion - SPM CantileversNational Harbor 5
Session chair: Christina Newcomb, Stanford University, US
Panelist
O. Krause, NanoWorld AG, CH
Panelist
S. Jesse, Oak Ridge National Laboratory, US
Panelist
A. Eskandarian, Harvard Medical School, US

Wednesday June 19

9:00SPMConnect: Chemical SpectroscopyNational Harbor 5
Session chair: Greg Haugstad, University of Minnesota, US
AFM-IR technique development in applications to industrial research
G. Haugstad, B. Luo, B. Curtin, K. Wormuth, University of Minnesota, US
Cross-correlated SPM and TERS/TEPL imaging: unique tool for nanoscale structural characterization of 2D semiconductors and the vertical / lateral heterostructures thereof.
A. Krayev, HORIBA Scientific, US
Optimized Spatial Resolution, Sensitivity, Measurement Speed and Artifact Reduction in Photothermal AFM-IR
C. Phillips, M. Wagner, Q. Hu, C. Li, P. Dewolf, Bruker Nano, US
10:00Scanning Probe Microscopy of 2D MaterialsNational Harbor 5
Session chair: Greg Haugstad, University of Minnesota, US
Torsional Force Microscopy of Van der Waals Moires and Atomic Lattices
M. Pendharkar, Stanford University, US
Scanning probe microscopy as a tool to uncover new phenomena in twisted 2D materials
A. Luican-Mayer, University of Ottawa, CA
The challenge of automating and summarizing analysis of particles in multiple AFM datasets
M. Cognard, Digital Surf, FR
Exfoliation of Nanoribbons from Bulk van der Waals Crystals for Optical and Electronic Characterization
A.P. Saunders, A. Krayev, V. Chen, A.C. Johnson, A.S. McKeown-Green, H.J. Zeng, E. Pop, F. Liu, Stanford University, US
Mechanical, electrical and KPFM investigations of ultrathin membranes of MoSSe alloy
J. Serafińczuk, A. Piejko, M. Tamulewicz-Szwajkowska, K. Król , R. Kudrawiec, Wroclaw University of Science and Technology, PL
1:30SPMConnect: SPM of Cells, Biomolecules & BiomaterialsNational Harbor 5
Session chair: Simona Patange, NIST, US
Revealing a « New Microbiology » using Long-Term Time-Lapse Atomic Force Microscopy
H.A. Eskandarian, Harvard Medical School, US
Discovery of a fundamental class of solid matter with the atomic force microscope
O. Sahin, Columbia University, US
Single molecule analysis of nucleosomes by high-speed atomic force microscopy
D.P. Melters, K.C. Neuman, Y. Dalal, National Institutes of Health, US
Program biopolymer-van der Waals interfaces
S. Zhang, W. Zhou, J. Chen, B. Harris, M. Baer, C.L. Chen, J. DeYoreo, Pacific Northwest National Laboratory, US
3:00SPMConnect: Electrical modes II (Electromechanics)National Harbor 5
Session chair: Peter Grutter, McGill University, CA
Resolving the impact of microstructure on optoelectronic properties via correlative atomic force microscopy
I. Hermes, Leibniz Institute of Polymer Research, DE
Improved AFM Measurement Accuracy and Precision Using Quadrature Phase Differential Interferometry for Tip Displacement Sensing
R. Proksch, A. Labuda, J. Lefever, J. Li, F.T. Limpoco, B. Ohler, Oxford Instruments Asylum Research Inc., US
Numerical modeling for piezo force microscopy measurements
G. Stan, National Institute of Standards and Technology, US
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