2,000 Femtometers Below the Noise: Frontiers in Accurate and Quiet Atomic Force Microscopy

Ben Ohler

Senior Product Line Manager

Oxford Instruments Asylum Research, Inc.

Dr. Ben Ohler is Senior Product Line Manager for atomic force microscopy (AFM) at Oxford Instruments. He earned his Ph.D. in chemical engineering from the University of California, Santa Barbara, where he was introduced to AFM and applied it to lipid biophysics related to multiple sclerosis.

Since 1999, Dr. Ohler has worked in the AFM industry as an applications scientist and product marketing leader, joining Oxford Instruments Asylum Research in 2013. His role focuses on understanding global research needs in academia and industry, defining AFM product solutions, and communicating their value across diverse scientific fields. His contributions have helped deliver numerous successful AFM products, including blueDrive photothermal excitation, the Cypher VRS video-rate AFM, the Jupiter large-sample AFM platform, and the Vero AFM family with interferometric cantilever sensing.