Johann Foucher is the CEO and founder in 2014 of POLLEN Metrology, a leading-edge company in Smart Process control software to accelerate the development of high-performance materials with its unique AI software technology. Before POLLEN, Johann was project manager at IBM (NY) from 2007 to 2012 in the field of advanced process control and specialized in CD-SEM and 3DAFM technologies. From 2003 to 2007, he was a researcher at CEA/LETI institute in the field of nanometrology for semiconductor industry. He has published more than 70 papers, gave numerous invited talks at international conferences and has been granted nine patents.
Johann received in 2003 a PhD degree in plasma physics applied to advanced semiconductor CMOS gate etching from University Grenoble Alpes and an engineering degree in 1999 in electronics and plasmas physics from Polytech Orleans.