Structural influence of nitrogen adducts on the morphology of bismuth sulphide thin films

S.A. Saah, J.A.M. Awudza, N. Revaprasadu
University of Energy and Natural Resources,

Keywords: bismuth ethyl xanthate, spin coating, scanning electron microscopy, x-ray defractometry


Four adducts of bismuth ethyl xanthate Bi(S2COEt)3.L [L = tetramethylethylenediamine (TMEDA), triethylamine, 1, 10 phenanthroline or pyridine] have been synthesized and characterized. Spin coating of the complexes on glass substrates followed by heating at 200 °C under nitrogen atmosphere for 30 minutes decomposed all the complexes to form Bi2S3 thin films as confirmed by p-XRD. SEM showed that the nature of the adduct ligand had an effect on the morphology of the thin films formed changing from wires for TMEDA to cluster of rods for triethylamine and pyridine to dots for 1, 10 phenanthroline. All the deposited Bi2S3 thin films showed a 2:3 ratio of Bi:S as evident from the EDX analyses.