Materials Characterization & Imaging

Nanoscale Materials Characterization

Symposium Co-Chairs

Pierre Panine
Senior Scientist
Xenocs SA, France

Greg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota

Dalia Yablon
Founder
SurfaceChar LLC

Key Speakers

Photo-induced force microscopy: a technique for hyperspectral nanochemical mapping
Sung Park
CEO, Molecular Vista

Nanocharacterization of Exosomes
James Gimzewski
Professor, Director Nano & Pico Characterization Lab, University of California, Los Angeles

Kevin Kjoller
Vice President
Anasys Instruments

Nanoscale Characterization of Solar Cells by Conductive and Photoconductive Atomic Force Microscopy
Thuc-Quyen Nguyen
Professor, Department of Chemistry and Biochemistry, University of California, Santa Barbara

Symposium Sessions
	Wednesday May 16
8:30	Characterizing Soft/Bio Materials
10:30	Materials Characterization & Imaging I
1:30	Materials Characterization & Imaging II
3:30	Materials Characterization & Imaging: Posters

Symposium Program
	Wednesday May 16

8:30	Characterizing Soft/Bio Materials	251 C
	Session chair: Dalia Yablon, SurfaceChar LLC, US
8:30	Nanocharacterization of Exosomes (invited presentation) J. Gimzewski, University of California, Los Angeles, US
8:55	The developments of a Helium Acoustic Levitation Environment for time resolved XFEL experiments E.R. Dye, R.H. Morris, M.I. Newton, D. Axford, P. Aller, A.M. Orville, P.T. Docker, Nottingham Trent University, UK
9:15	Abrasive scanning with AFM on biocompatible polymers: measuring dry vs. swollen film thickness and probing properties G. Haugstad, K. Wormuth, University of Minnesota, US
9:35	Nano-JKR Method Eliminates Adhesion Errors in Nanoindentation of Compliant Polymers and Hydrogels D.M. Ebenstein, Bucknell University, US
9:55	Thorough Characterization of Liposomes by Complementary Light and X-Ray Scattering Techniques R. Ragheb, J. Bolze, G. Taylor, N. Tamaddoni, D. Griffiths, U. Nobbmann, Malvern Panalytical, US

10:30	Materials Characterization & Imaging I	251 C
	Session chair: Greg Haugstad, University of Minnesota, US
10:30	Chemical, Mechanical and Optical Property Mapping at the Nanoscale (invited presentation) K. Kjoller, E. Dillon, Q. Hu, A. Roy, H. Yang, C. Prater, Ansys Instruments, US
10:55	Photo-induced force microscopy: a technique for hyperspectral nanochemical mapping (invited presentation) S. Park, D. Nowak, T. Albrecht, Molecular Vista, US
11:20	Alignment-free Plasmonic Nanowire Optical Probe for Tip-enhanced Raman Spectroscopy S. Kim, Y. Zhu, X. Ma, R. Yan, University of California, Riverside, US

1:30	Materials Characterization & Imaging II	251 C
	Session chair: Dalia Yablon, SurfaceChar, US; Greg Haugstad, University of Minnesota, US
1:30	Nanoscale Characterization of Solar Cells by Conductive and Photoconductive Atomic Force Microscopy (invited presentation) T-Q. Nguyen, University of California, Santa Barbara, US
1:55	Quantitative measurement of active dopant density distribution in textured emitter of phosphorus-implanted monocrystalline silicon solar cell using scanning nonlinear dielectric microscopy K. Hirose, K. Tanahashi, H. Takato, Y. Cho, Tohoku University, JP
2:15	Effect of filler size in a graphene-anthracene carbon-carbon composite M. Singh, R. Vander Wal, Pennsylvania State University, US
2:35	Spectroscopic Diagnostics And Material Characterization For Wave Liquefaction™ Processing Of Carbon Materials For The Production Of Value-Added Chemicals And Feedstocks R. Vander Wal, A. Sengupta, E. Musselman, K. Zeller, G. Skoptsov, Penn State University, US

3:30	Materials Characterization & Imaging: Posters	2nd Floor
	Magnetometry Measurements of Nanomagnetic Materials B.C. Dodrill, Lake Shore Cryotronics, US
	Characterization of Polymer Nanocomposites with Thermal Analysis and Spectrum techniques M.E. Mena Navarro, R.F. Estrada Guerrero, L.A. Torres González, R. Tinajero, L. Palafox, Universidad Iberoamericana Ciudad de Mexico, MX
	Acid Electrolytes Effect on In-Situ Growth and Morphology of Polymer Nanowires in Microelectrode Devices M. Mushfiq, M.M. Alam, InnoSense LLC, US
	Effects of Ca doping on Grain and Grain Boundary Properties of ZnO-Zn2BiVO6-Co3O4 Ceramics using Dielectric Functions for Surge Arrestor Y.W. Hong, M.J. Ha, J.H. Paik, J.H. Cho, Y.H. Jeong, J.S. Yun, W.I. Park, Korea Institute of Ceramic Engineering & Technology, KR
	Liquid-Metal-Jet and High-Resolution X-Ray Source Technology for Imaging J. Hallstedt, A. Adibhatla, B. Hansson, O. Hemberg, G. Johansson, M. Otendal, P. Takman, T. Tuohimaa, Exillum Inc, US

Most technological research includes advanced material characterization needs. This event promotes rapid education, dissemination, and commercialization of new characterization techniques into industries based in both physical and life sciences. It seeks to introduce general technique types to newcomers, report pioneering methods, and drill down into new physical understandings, all the while addressing applications useful to industrial engineers and technicians. As can be seen by the list of topics below, all major characterization capabilities are covered including microscopy (electron, optical, scanning probe), spectroscopy, x-ray based methods and hybrid techniques.

Advances in characterization include not only far-field probes (e.g., beams of electrons, ions, neutrons or photons) and near-field probes (indentors, nanotips, fibers and nanotubes), but also a growing intellectual component whereby data are manipulated, analyzed, rendered and simulated to yield meaningful information. As some tools and methods have become more common and practical, certain misunderstandings and misinterpretations also have crept into the lexicon. Besides an element of "methods training" to promote the insightful application of characterization tools in nanotechnology R&D, this symposium will emphasize projects utilizing a spectrum of complementary techniques.