Kevin is regarded within the SPM industry as one of the world’s leading technology and applications experts on the Scanning Probe Microscope. Kevin has been involved with the research and development of SPMs since 1987, mostly within Digital Instruments, and then later Veeco Metrology. At different points through his 16 year career with DI/Veeco, he managed all of the applications and research for SPM product development. At Anasys, he is responsible for the development of the award-winning nanoTA2 technology and VESTA systems, in addition to a wide range of nano thermal applications. He has a BS in Physics from the University of California, Santa Barbara.