Materials Characterization & Imaging

Nanoscale Materials Characterization

Symposium Co-Chairs

Pierre Panine
Senior Scientist
Xenocs SA, France

Greg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota

Dalia Yablon
Founder
SurfaceChar LLC

Key Speakers

Reconstruction of the Distributed Force on an Atomic Force Microscope Cantilever
Ryan Wagner
Mechanical Engineer, National Institute of Standards and Technology

Hybrid transmission electron microscope: An integrated platform for in situ imaging and spectroscopies
Canhui Wang
Postdoctoral Researcher, CNST/UMD, National Institute of Standards and Technology

AFSEM™ - correlative in situ atomic force microscopy in electron and ion beam microscopes
Edward Nelson
Nanosurf Inc

In-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force micrscope
Song Xu
Sr. Application Scientist, Keysight Technologies

Toward improved accuracy in nanomechanical measurements with Atomic Force Microscopy
Bede Pittenger
Applications Scientist, Bruker Corporation

In situ X-ray scattering studies of nanomaterials for energy
Byeongdu Lee
Physicist, Chemical and Materials Science, Argonne National Laboratory

Video-Rate Atomic Force Microscopy
Roger Proksch
President, Asylum Research, an Oxford Instruments Company

Graphene Moiré Pattern Ultra-High Resolution Atomic Force Microscopy
Byong Kim
Applications Group Director, Park Systems

Symposium Sessions
	Monday May 15
10:30	Materials for Personal/Home Care & Cosmetics
1:30	Nanoparticle Characterization
	Tuesday May 16
10:30	Nanoparticles for Imaging & Diagnostics
1:30	Characterizing Materials In Situ
	Wednesday May 17
8:30	Characterizing Materials using AFM I
10:30	Characterizing Materials using AFM II
	Materials Characterization: Posters

Symposium Program
	Monday May 15

10:30	Materials for Personal/Home Care & Cosmetics	Potomac 1
	Session chair: Prithwiraj Maitra, Johnson and Johnson, US
10:30	Structure Development in Personal Care Coatings (invited presentation) M. de Mul, BASF, US
10:55	Simultaneous Small Angle and Wide Angle X-ray Scattering (SAXS/WAXS) for the Characterization of Nanostructure in Personal Care, Cosmetic, and Food Products. (invited presentation) S. Barton, SAXSLAB, US
11:20	Triggered Self Assembly Materials for Hair Applications (invited presentation) S. Amin, L'Oreal Americas, US
11:45	ActiVlayr Nanofiber Technology, vol. 3: pp. 36-39 I. Hosie, Revolution Fibres Ltd, NZ

1:30	Nanoparticle Characterization	National Harbor 4
	Session chair: Pierre Panine, Xenocs SA, France
1:30	Quantitative Analysis of Oxidation State in Cerium Oxide Nanomaterials, vol. 1: pp. 17-20 C.M. Sims, R.A. Maier, A.C. Johnston-Peck, J.M. Gorham, V.A. Hackley, B.C. Nelson, National Institute of Standards and Technology, US
1:50	Development and Characterization of Commercial Boron Nitride Nanotube Product Forms, vol. 1: pp. 114-117 M.B. Jakubinek, Y. Martinez-Rubi, K.S. Kim, Z.J. Jakubek, C.M. Homenick, S. Zou, D. Klug, B. Ashrafi, J. Guan, S. Walker, M. Daroszewska, C.T. Kingston, B. Simard, National Research Council Canada, CA
2:10	Assessing Drug Encapsulation Efficiency using Nanoparticle Tracking Analysis R. Ragheb, D. Griffiths, Malvern Instrument, US
2:30	FibriPy: a software environment for fiber analysis from 3D micro-computed tomography data, vol. 1: pp. 25-28 T. Perciano, D. Ushizima, H. Krishnan, J. Sethian, Lawrence Berkeley National Laboratory, US
2:50	Calibration Devices for Optical Microscopy at Subnanometer Scales C.R. Copeland, J.A. Liddle, C.D. McGray, J. Geist, B.R. Ilic, S.M. Stavis, National Institute of Standards and Technology, US
3:10	How to Caracterize Soft Nanoparticles L. Calzolai, P. Urban, P. Iavicoli, European Commission- DG Joint Research Centre, IT
	Tuesday May 16

10:30	Nanoparticles for Imaging & Diagnostics	Chesapeake 10-12
	Session chair: Shanta Dhar, University of Miami, US; Dalia Yablon, SurfaceChar LLC, US
10:30	Nanoparticle Imaging Probes for Molecular Imaging with Computed Tomography (invited presentation) R. Roeder, University of Notre Dame, US
10:55	Self-therapeutic Nanoparticles for Atherosclerosis (invited presentation) S. Dhar, University of Miami, US
11:20	Novel fluorescent nanoparticles for ultrasensitive identification of nucleic acids by optical methods, vol. 3: pp. 118-121 M. Westergaard Mulberg, M. Taskova, A. Okholm, J. Kjems, K. Astakhova, University of Southern Denmark, DK
11:40	Non–enzymatic electrochemical sensing platforms using –cyclodextrin and multi–walled carbon nanotubes for selective detection of uric acid M.B. Wayu, M.A. Schwarzmann, S.D. Gillespie, M.C. Leopold, University of Richmond, US
12:00	Pore Size and its Effect on Molybdenum Retention in Mesoporous Alumina, vol. 1: pp. 110-113 R. Hepburn, S. Tsubota, Fujimi Corporation, US

1:30	Characterizing Materials In Situ	National Harbor 7
	Session chair: Greg Haugstad, University of Minnesota, US
1:30	Hybrid transmission electron microscope: An integrated platform for in situ imaging and spectroscopies (invited presentation) C. Wang, W-C Yang, R. Sharma, National Institute of Standards and Technology, US
1:55	Nanofluidic Liquid Cell with Integrated Electrokinetic Pump for In Situ TEM C.H. Ray, B.R. Ilic, R. Sharma, G. Holland, V. Aksyuk, S.M. Stavis, J.A. Liddle, National Institute of Standards and Technology, US
2:15	In situ TEM/STEM of the Coarsening of Nanoporous Gold, vol. 1: pp. 9-12 A.A. El-Zoka, J. Howe, R.C. Newman, D. Perovic, University of Toronto, CA
2:35	Probing Nanoscale Composites, Interfaces, and Damage Gradients with In-Situ and Ex-Situ Multiscale Mechanical Methodologies, vol. 1: pp. 29-31 N.A. Mara, Los Alamos National Laboratory, US
2:55	In situ X-ray scattering studies of nanomaterials for energy (invited presentation) B. Lee, Argonne National Laboratory, US
3:20	In situ Rheology with Small Angle x-ray Scattering and x-ray Photon Correlation Spectroscopy X-M Lin, J. Lee, Z. Jiang, J. Wang, A.R. Sandy, S. Narayanan, Argonne National Laboratory, US
3:40	In-situ Investigation of Metal Corrosion and Corrosion-Resistant Coatings by Micro-Beam X-ray Spectroscopy and Electron Microscopy K. Chen-Wiegart, M. Ge, G. Williams, E. Nazaretsky, Y. Chu, J. Thieme, K. Kisslinger, E.A. Stach, H. Jiang, K. Foster, D. Vonk, KW. Chou, S. Petrash, Henkel Corporation, US
	Wednesday May 17

8:30	Characterizing Materials using AFM I	National Harbor 7
	Session chair: Dalia Yablon, SurfaceChar LLC
8:30	Reconstruction of the Distributed Force on an Atomic Force Microscope Cantilever (invited presentation) R. Wagner, National Institute of Standards and Technology, US
8:55	AFSEM™ - correlative in situ atomic force microscopy in electron and ion beam microscopes (invited presentation) E. Nelson, Nanosurf, inc., US
9:20	Video-Rate Atomic Force Microscopy (invited presentation) M. Kocun, I. Revenko, T. Limpoco, D. Walters, M. Viani, R. Proksch, Asylum Research, US
9:45	In-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force micrscope (invited presentation) S. Xu, Keysight Technologies, US

10:30	Characterizing Materials using AFM II	National Harbor 7
	Session chair: Greg Haugstad, University of Minnesota, US
10:30	Graphene Moiré Pattern Ultra-High Resolution Atomic Force Microscopy (invited presentation) B. Kim, Park Systems, US
10:55	Toward improved accuracy in nanomechanical measurements with Atomic Force Microscopy (invited presentation) B. Pittenger, S. Hu, J. Mosley, L. Huang, J. He, P. Dewolf, Bruker Corporation, US
11:20	G-Mode KPFM: Bringing Kelvin probe force microscopy into the information age, vol. 1: pp. 1-4 L. Collins, S. Kalinin, S. Jesse, Oak Ridge National Laboratory, US
11:40	Learning the Physics and Chemistry of Surfaces via Machine Vision and Deep Data Analysis, vol. 1: pp. 5-8 M. Ziatdinov, A. Maksov, S.V. Kalinin, Oak Ridge National Laboratory, US
12:00	High-resolution high-speed dynamic mechanical spectroscopy (FT-nanoDMA) of biological cells with the help of AFM M.E. Dokukin, I. Sokolov, NanoScience Solutions, US

	Materials Characterization: Posters	Potomac Registration Hall
	Comparative HRTEM Examination of Carbon Black and Soot Structures, vol. 1: pp. 21-24 J.M. Spry, S.P. Compton, MVA Scientific Consultants, US
	Advanced Characterization of Nanoporous Gold, vol. 1: pp. 36-39 A.A. El-Zoka, R.C. Newman, B. Langelier, University of Toronto, CA
	SEM Characterization of Adipose Tissue Structure, vol. 1: pp. 13-16 V. Brimiene, R. Skaudzius, M. Misevicius, G. Brimas, E. Brimas, A. Kareiva, Vilnius University, LT
	Towards Medical Diagnostics Using Hyperspectral X-ray Scatter, vol. 1: pp. 32-35 C. Greenwood, K. Rogers, M. Wilson, I. Lyburn, P. Evans, G. Davies, Cranfield University, UK
	Characterization of Nanoparticle Concentration in Complex Drugs by Microdroplet Deposition and Optical Microscopy J. Myung, L.C. Elliott, S.M. Stavis, J. Zheng, D. Kozak, FDA, US
	Novel “Ringing” non-resonant oscillatory AFM mode M.E. Dokukin, I. Sokolov, NanoScience Solutions, US

Most technological research includes advanced material characterization needs. This event promotes rapid education, dissemination, and commercialization of new characterization techniques into industries based in both physical and life sciences. It seeks to introduce general technique types to newcomers, report pioneering methods, and drill down into new physical understandings, all the while addressing applications useful to industrial engineers and technicians. As can be seen by the list of topics below, all major characterization capabilities are covered including microscopy (electron, optical, scanning probe), spectroscopy, x-ray based methods and hybrid techniques.

Advances in characterization include not only far-field probes (e.g., beams of electrons, ions, neutrons or photons) and near-field probes (indentors, nanotips, fibers and nanotubes), but also a growing intellectual component whereby data are manipulated, analyzed, rendered and simulated to yield meaningful information. As some tools and methods have become more common and practical, certain misunderstandings and misinterpretations also have crept into the lexicon. Besides an element of "methods training" to promote the insightful application of characterization tools in nanotechnology R&D, this symposium will emphasize projects utilizing a spectrum of complementary techniques.