Industry-tailored characterisation of micro- and nano-electronic devices using neutrons and synchrotron X-raysE. Capria, J. Beaucourt, I. Bertrand, N. Bicais, E. Boller, C. Curfs, G. Chahine, A. Fitch, R. Kluender, T.A. Lafford, Y.M. Le-Vaillant, F. Loru, J.S. Micha, E. Mitchell, O. Robach, J.C. Royer, T. Schulli, J. Segura-Ruiz,
European Synchrotron (ESRF), FR