Sunday, May 14, 2017, 9:00 am - 5:00 pm, Gaylord National Convention Center, Washington, DC
The workshop will provide an overview of materials characterization methods used to probe a wide variety of properties with an emphasis on real-world applications in industries including biomedical, pharmaceutical, chemicals, personal care, semiconductor, coatings, and energy. Covers both basic and deeper understandings of commonly available techniques, and correspondingly both basic and more insightful applications.
We explore capabilities to measure material properties such as morphology, elemental information, chemical information, and mechanical/electrical properties. Techniques covered include: XPS, SEM, TEM, XRD, Raman/IR, nanoindentation, AFM. For each technique, an overview of each method will be presented explaining basics of operation as well as some finer points and more advanced understandings; this is followed by applications to various industries. The purpose is to provide attendees with a basic landscape of what capabilities are possible and how to astutely use these methods to solve practical real-world problems; and in the process, how to avoid certain misconceptions. Overall the course will compare and contrast differences in capabilities, sample preparation required, and information provided from these methods.
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