TechConnect World 2017
National SBIR/STTR Conference National Innovation Summit & Showcase Nanotech 2017

Materials Characterization & Imaging

Nanoscale Materials Characterization

Symposium Co-Chairs

Pierre PaninePierre Panine
Senior Scientist
Xenocs SA, France

Greg HaugstadGreg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota

Dalia YablonDalia Yablon
Founder
SurfaceChar LLC

Key Speakers

Ryan WagnerReconstruction of the Distributed Force on an Atomic Force Microscope Cantilever
Ryan Wagner
Mechanical Engineer, National Institute of Standards and Technology

Canhui WangHybrid transmission electron microscope: An integrated platform for in situ imaging and spectroscopies
Canhui Wang
Postdoctoral Researcher, CNST/UMD, National Institute of Standards and Technology

Edward NelsonAFSEM™ - correlative in situ atomic force microscopy in electron and ion beam microscopes
Edward Nelson
Nanosurf Inc

Song XuIn-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force micrscope
Song Xu
Sr. Application Scientist, Keysight Technologies

Bede PittengerToward improved accuracy in nanomechanical measurements with Atomic Force Microscopy
Bede Pittenger
Applications Scientist, Bruker Corporation

Byeongdu LeeIn situ X-ray scattering studies of nanomaterials for energy
Byeongdu Lee
Physicist, Chemical and Materials Science, Argonne National Laboratory

Roger ProkschVideo-Rate Atomic Force Microscopy
Roger Proksch
President, Asylum Research, an Oxford Instruments Company

Byong KimGraphene Moiré Pattern Ultra-High Resolution Atomic Force Microscopy
Byong Kim
Applications Group Director, Park Systems


Symposium Sessions

Monday May 15

10:30Materials for Personal/Home Care & Cosmetics
1:30Nanoparticle Characterization

Tuesday May 16

10:30Nanoparticles for Imaging & Diagnostics
1:30Characterizing Materials In Situ

Wednesday May 17

8:30Characterizing Materials using AFM I
10:30Characterizing Materials using AFM II
Materials Characterization: Posters

Symposium Program

Monday May 15

10:30Materials for Personal/Home Care & CosmeticsPotomac 1
Session chair: Prithwiraj Maitra, Johnson and Johnson, US
10:30Structure Development in Personal Care Coatings (invited presentation)
M. de Mul, BASF, US
10:55Simultaneous Small Angle and Wide Angle X-ray Scattering (SAXS/WAXS) for the Characterization of Nanostructure in Personal Care, Cosmetic, and Food Products. (invited presentation)
S. Barton, SAXSLAB, US
11:20TBA (invited presentation)
S. Amin, L'Oreal Americas, US
11:45ActiVlayr Nanofiber Technology
I. Hosie, Revolution Fibres Ltd, NZ
1:30Nanoparticle CharacterizationNational Harbor 4
Session chair: Pierre Panine, Xenocs SA, France
1:30Quantitative Analysis of Oxidation State in Cerium Oxide Nanomaterials
C.M. Sims, R.A. Maier, A.C. Johnston-Peck, J.M. Gorham, V.A. Hackley, B.C. Nelson, National Institute of Standards and Technology, US
1:50Development and Characterization of Commercial Boron Nitride Nanotube Product Forms
M.B. Jakubinek, Y. Martinez-Rubi, K.S. Kim, Z.J. Jakubek, C.M. Homenick, S. Zou, D. Klug, B. Ashrafi, J. Guan, S. Walker, M. Daroszewska, C.T. Kingston, B. Simard, National Research Council Canada, CA
2:10Assessing Drug Encapsulation Efficiency using Nanoparticle Tracking Analysis
R. Ragheb, D. Griffiths, Malvern Instrument, US
2:30FibriPy: a software environment for fiber analysis from 3D micro-computed tomography data
T. Perciano, D. Ushizima, H. Krishnan, J. Sethian, Lawrence Berkeley National Laboratory, US
2:50Calibration Devices for Optical Microscopy at Subnanometer Scales
C.R. Copeland, J.A. Liddle, C.D. McGray, J. Geist, B.R. Ilic, S.M. Stavis, National Institute of Standards and Technology, US
3:10How to Caracterize Soft Nanoparticles
L. Calzolai, P. Urban, P. Iavicoli, European Commission- DG Joint Research Centre, IT

Tuesday May 16

10:30Nanoparticles for Imaging & DiagnosticsChesapeake 10-12
Session chair: Shanta Dhar, University of Miami, US; Dalia Yablon, SurfaceChar LLC, US
10:30Nanoparticle Imaging Probes for Molecular Imaging with Computed Tomography (invited presentation)
R. Roeder, University of Notre Dame, US
10:55Self-therapeutic Nanoparticles for Atherosclerosis (invited presentation)
S. Dhar, University of Miami, US
11:20Novel fluorescent nanoparticles for ultrasensitive identification of nucleic acids by optical methods
M. Westergaard Mulberg, M. Taskova, A. Okholm, J. Kjems, K. Astakhova, University of Southern Denmark, DK
11:40Non–enzymatic electrochemical sensing platforms using –cyclodextrin and multi–walled carbon nanotubes for selective detection of uric acid
M.B. Wayu, M.A. Schwarzmann, S.D. Gillespie, M.C. Leopold, University of Richmond, US
12:00Pore Size and its Effect on Molybdenum Retention in Mesoporous Alumina
R. Hepburn, S. Tsubota, Fujimi Corporation, US
1:30Characterizing Materials In SituNational Harbor 7
Session chair: Greg Haugstad, University of Minnesota, US
1:30Hybrid transmission electron microscope: An integrated platform for in situ imaging and spectroscopies (invited presentation)
C. Wang, W-C Yang, R. Sharma, National Institute of Standards and Technology, US
1:55Nanofluidic Liquid Cell with Integrated Electrokinetic Pump for In Situ TEM
C.H. Ray, B.R. Ilic, R. Sharma, G. Holland, V. Aksyuk, S.M. Stavis, J.A. Liddle, National Institute of Standards and Technology, US
2:15In situ TEM/STEM of the Coarsening of Nanoporous Gold
A.A. El-Zoka, J. Howe, R.C. Newman, D. Perovic, University of Toronto, CA
2:35Probing Nanoscale Composites, Interfaces, and Damage Gradients with In-Situ and Ex-Situ Multiscale Mechanical Methodologies
N.A. Mara, Los Alamos National Laboratory, US
2:55In situ X-ray scattering studies of nanomaterials for energy (invited presentation)
B. Lee, Argonne National Laboratory, US
3:20In situ Rheology with Small Angle x-ray Scattering and x-ray Photon Correlation Spectroscopy
X-M Lin, J. Lee, Z. Jiang, J. Wang, A.R. Sandy, S. Narayanan, Argonne National Laboratory, US
3:40In-situ Investigation of Metal Corrosion and Corrosion-Resistant Coatings by Micro-Beam X-ray Spectroscopy and Electron Microscopy
K. Chen-Wiegart, M. Ge, G. Williams, E. Nazaretsky, Y. Chu, J. Thieme, K. Kisslinger, E.A. Stach, H. Jiang, K. Foster, D. Vonk, KW. Chou, S. Petrash, Henkel Corporation, US

Wednesday May 17

8:30Characterizing Materials using AFM INational Harbor 7
Session chair: Dalia Yablon, SurfaceChar LLC
8:30Reconstruction of the Distributed Force on an Atomic Force Microscope Cantilever (invited presentation)
R. Wagner, National Institute of Standards and Technology, US
8:55AFSEM™ - correlative in situ atomic force microscopy in electron and ion beam microscopes (invited presentation)
E. Nelson, Nanosurf, inc., US
9:20Video-Rate Atomic Force Microscopy (invited presentation)
M. Kocun, I. Revenko, T. Limpoco, D. Walters, M. Viani, R. Proksch, Asylum Research, US
9:45In-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force micrscope (invited presentation)
S. Xu, Keysight Technologies, US
10:30Characterizing Materials using AFM IINational Harbor 7
Session chair: Greg Haugstad, University of Minnesota, US
10:30Graphene Moiré Pattern Ultra-High Resolution Atomic Force Microscopy (invited presentation)
B. Kim, Park Systems, US
10:55Toward improved accuracy in nanomechanical measurements with Atomic Force Microscopy (invited presentation)
B. Pittenger, S. Hu, J. Mosley, L. Huang, J. He, P. Dewolf, Bruker Corporation, US
11:20G-Mode KPFM: Bringing Kelvin probe force microscopy into the information age
L. Collins, S. Kalinin, S. Jesse, Oak Ridge National Laboratory, US
11:40Learning the Physics and Chemistry of Surfaces via Machine Vision and Deep Data Analysis
M. Ziatdinov, A. Maksov, S.V. Kalinin, Oak Ridge National Laboratory, US
12:00High-resolution high-speed dynamic mechanical spectroscopy (FT-nanoDMA) of biological cells with the help of AFM
M.E. Dokukin, I. Sokolov, NanoScience Solutions, US
Materials Characterization: PostersPotomac Registration Hall
Comparative HRTEM Examination of Carbon Black and Soot Structures
J.M. Spry, S.P. Compton, MVA Scientific Consultants, US
Advanced Characterization of Nanoporous Gold
A.A. El-Zoka, R.C. Newman, B. Langelier, University of Toronto, CA
SEM Characterization of Adipose Tissue Structure
V. Brimiene, R. Skaudzius, M. Misevicius, G. Brimas, E. Brimas, A. Kareiva, Vilnius University, LT
Towards Medical Diagnostics Using Hyperspectral X-ray Scatter
C. Greenwood, K. Rogers, M. Wilson, I. Lyburn, P. Evans, G. Davies, Cranfield University, UK
The Wear of Cutting Pellets Coated with TiAlN During Machining of a Cobalt Superalloy (FSX-414)
A. Sebhi, N. Douib, University Med Boudiaf M'Sila, UK
Characterization of Nanoparticle Concentration in Complex Drugs by Microdroplet Deposition and Optical Microscopy
J. Myung, L.C. Elliott, S.M. Stavis, J. Zheng, D. Kozak, FDA, US
Novel “Ringing” non-resonant oscillatory AFM mode
M.E. Dokukin, I. Sokolov, NanoScience Solutions, US

Most technological research includes advanced material characterization needs. This event promotes rapid education, dissemination, and commercialization of new characterization techniques into industries based in both physical and life sciences. It seeks to introduce general technique types to newcomers, report pioneering methods, and drill down into new physical understandings, all the while addressing applications useful to industrial engineers and technicians. As can be seen by the list of topics below, all major characterization capabilities are covered including microscopy (electron, optical, scanning probe), spectroscopy, x-ray based methods and hybrid techniques.

Advances in characterization include not only far-field probes (e.g., beams of electrons, ions, neutrons or photons) and near-field probes (indentors, nanotips, fibers and nanotubes), but also a growing intellectual component whereby data are manipulated, analyzed, rendered and simulated to yield meaningful information. As some tools and methods have become more common and practical, certain misunderstandings and misinterpretations also have crept into the lexicon. Besides an element of "methods training" to promote the insightful application of characterization tools in nanotechnology R&D, this symposium will emphasize projects utilizing a spectrum of complementary techniques.

Topics & Application Areas

  • In-Situ/Environmental Characterization: AFM, TEM/SEM, Spectroscopy, X-Ray Based Methods
  • Nanoparticles Characterization: Dimensions, Shape, Concentration, Orientation in a Matrix, Polydispersity, Metrology
  • Composites Characterization: From Nano to Micron Scale
  • Multiscale Structures Characterization in Biotech & Medical Devices
  • Characterization in Pharma & Personal Care
  • Advances in Instrumentation
  • Other

Related Industrial Impact Workshops

Sponsor & Exhibitor Opportunities

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Platinum Sponsors
Korusip
KIAT and KETEP
Lockheed Martin
NSTXL

Silver Sponsors
Fujifilm
TechOpp

Corporate Acceleration Partners
Aerojet
Arkema
Baxter
Boeing
Church & Dwight
Corning
Cummins
Eastman Chemical
Energizer Holdings Inc.
Evonik
Henkel
Huntsman
Ingersoll_Rand
LG
Lockheed Martin
LOreal
Magna
Medtronic
Michelman
Owens Corning
Panasonic
Praxair
Sabic
SAINT-GOBAIN
Shell
Sherwin Williams
UTC

Technology Development Partners
 
AirForce Technology Transfer
Argonne
Business Sweden
ceatech
Fermilab
GLEAMM
Idaho National Laboratory
Innovate Hawaii
InvestInSkane
Iowa State University
Jefferson Lab
Kansas City National Security Campus
korusip
KYUNGPOOK National University
Lawrence Berkeley National Laboratory
NASA
NETL
NREL
New Jersey Innovation Institute
University of Buffalo NYSCEMI
OakRidgeNatLab
PolyU
PPPL
Sandia National Laboratories
SungKyunKwan University
Texas Tech Research Commercialization
UCI
University Of Melbourne
University Of Minnesota
University Of Vermont
UCLA Technology Development Group
UCSB
Vermont Department Economic Development
Vermont Technology Council

Supporting Partners
ACCT
American Elements
Angel Capital Associates
AOCS
Arrowhead Center
Asia Nano Forum
AURP
AUTM
BILAT USA 4.0
Coatings
Diplomacy Matters
European Commission
European Cluster Collaboration Platform
Explore Nano
FCHEA
FLC
Graphene Council
INNO
InterNano
Journal of Nanobiotechnology
LES
NVCA
NCURA
NECEC
SBIR
SBDC
Taylor Francis CRC
Texas Nanotech Initiative
UIDP

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