TechConnect World 2017
National SBIR/STTR Conference National Innovation Summit & Showcase Nanotech 2017

Materials Characterization & Imaging

Nanoscale Materials Characterization

Abstracts due: February 28, 2017

Technical Abstract Submission

Please first review the information for authors — abstract submission guidelines.

Symposium Co-Chairs

Pierre PaninePierre Panine
Senior Scientist
Xenocs SA, France

Greg HaugstadGreg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota

Dalia YablonDalia Yablon
Founder
SurfaceChar LLC

Key Speakers

Ryan WagnerRyan Wagner
Mechanical Engineer
National Institute of Standards and Technology

Edward NelsonAFSEM™ - correlative in situ atomic force microscopy in electron and ion beam microscopes
Edward Nelson
Nanosurf Inc

Song XuIn-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force micrscope
Song Xu
Sr. Application Scientist, Keysight Technologies

Bede PittengerToward improved accuracy in nanomechanical measurements with Atomic Force Microscopy
Bede Pittenger
Applications Scientist, Bruker Corporation

Cristiano L. P. OliveiraIn situ investigation of metallic nanoparticle nucleation
Cristiano L. P. Oliveira
Associated Professor, Institute of Physics, University of São Paulo, Brazil

Roger ProkschRoger Proksch
President
Asylum Research, an Oxford Instruments Company

Byeongdu LeeIn situ X-ray scattering studies of nanomaterials for energy
Byeongdu Lee
Physicist, Chemical and Materials Science, Argonne National Laboratory

Canhui WangHybrid transmission electron microscope: An integrated platform for in situ imaging and spectroscopies
Canhui Wang
Postdoctoral Researcher, CNST/UMD, National Institute of Standards and Technology


Symposium Sessions

Monday May 15

10:30Characterizing Materials In Situ I
1:30Characterizing Materials In Situ II

Tuesday May 16

1:30Nanoparticle Characterization

Wednesday May 17

8:30Characterizing Materials using AFM I
1:30Characterizing Materials using AFM II
Materials Characterization

Symposium Program

Monday May 15

10:30Characterizing Materials In Situ I
10:30In situ X-ray scattering studies of nanomaterials for energy (invited presentation)
B. Lee, Argonne National Laboratory, US
10:55In situ Rheology with Small Angle x-ray Scattering and x-ray Photon Correlation Spectroscopy
X-M Lin, J. Lee, Z. Jiang, J. Wang, A.R. Sandy, S. Narayanan, Argonne National Laboratory, US
11:15Investigating Material Structure Continuously from Angstroms to Microns with SAXS/WAXS/USAXS (invited presentation)
S. Barton, SAXSLAB, US
11:40In-situ Investigation of Metal Corrosion and Corrosion-Resistant Coatings by Micro-Beam X-ray Spectroscopy and Electron Microscopy
K. Chen-Wiegart, M. Ge, G. Williams, E. Nazaretsky, Y. Chu, J. Thieme, K. Kisslinger, E.A. Stach, H. Jiang, K. Foster, D. Vonk, KW. Chou, S. Petrash, Henkel Corporation, US
1:30Characterizing Materials In Situ II
1:30Hybrid transmission electron microscope: An integrated platform for in situ imaging and spectroscopies (invited presentation)
C. Wang, W-C Yang, R. Sharma, National Institute of Standards and Technology, US
1:55In-situ Characterization of Nanoscale Materials
A. Haque, Penn State University, US
2:15Nanofluidic Liquid Cell with Integrated Electrokinetic Pump for In Situ TEM
C.H. Ray, B.R. Ilic, R. Sharma, G. Holland, V. Aksyuk, S.M. Stavis, J.A. Liddle, National Institute of Standards and Technology, US
2:35In situ TEM/STEM of the Coarsening of Nanoporous Gold
A.A. El-Zoka, J. Howe, R.C. Newman, D. Perovic, University of Toronto, CA
2:55Probing Nanoscale Composites, Interfaces, and Damage Gradients with In-Situ and Ex-Situ Multiscale Mechanical Methodologies
N.A. Mara, Los Alamos National Laboratory, US

Tuesday May 16

1:30Nanoparticle Characterization
1:30Quantitative Analysis of Oxidation State in Cerium Oxide Nanomaterials
C.M. Sims, R.A. Maier, A.C. Johnston-Peck, J.M. Gorham, V.A. Hackley, B.C. Nelson, National Institute of Standards and Technology, US
1:50Development and Characterization of Commercial Boron Nitride Nanotube Product Forms
M.B. Jakubinek, Y. Martinez-Rubi, K.S. Kim, Z.J. Jakubek, C.M. Homenick, S. Zou, D. Klug, B. Ashrafi, J. Guan, S. Walker, M. Daroszewska, C.T. Kingston, B. Simard, National Research Council Canada, CA
2:10Assessing Drug Encapsulation Efficiency using Nanoparticle Tracking Analysis
R. Ragheb, D. Griffiths, Malvern Instrument, US
2:30FibriPy: a software environment for fiber analysis from 3D micro-computed tomography data
T. Perciano, D. Ushizima, H. Krishnan, J. Sethian, Lawrence Berkeley National Laboratory, US
2:50Nanotrap-enhanced mass spectrometry: direct detection of pathogen antigens in the urine of animal models and human patients affected by tick borne diseases
R. Magni, K. Jackson, R. Molestina, B. Kim, J. Walsh, B. Lepene, R. Dunlap, L. Liotta, A. Luchini, George Mason University, US
3:10Calibration Devices for Optical Microscopy at Subnanometer Scales
C.R. Copeland, J.A. Liddle, C.D. McGray, J. Geist, B.R. Ilic, S.M. Stavis, National Institute of Standards and Technology, US
3:30How to Caracterize Soft Nanoparticles
L. Calzolai, P. Urban, P. Iavicoli, European Commission- DG Joint Research Centre, IT

Wednesday May 17

8:30Characterizing Materials using AFM I
8:30TBA (invited presentation)
R. Wagner, National Institute of Standards and Technology, US
8:55AFSEM™ - correlative in situ atomic force microscopy in electron and ion beam microscopes (invited presentation)
E. Nelson, Nanosurf, inc., US
9:20TBA (invited presentation)
R. Proksch, Asylum Research, US
9:45In-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force micrscope (invited presentation)
S. Xu, Keysight Technologies, US
1:30Characterizing Materials using AFM II
1:30Toward improved accuracy in nanomechanical measurements with Atomic Force Microscopy (invited presentation)
B. Pittenger, S. Hu, J. Mosley, L. Huang, J. He, P. Dewolf, Bruker Corporation, US
1:55G-Mode KPFM: Bringing Kelvin probe force microscopy into the information age
L. Collins, S. Kalinin, S. Jesse, Oak Ridge National Laboratory, US
2:15Learning the Physics and Chemistry of Surfaces via Machine Vision and Deep Data Analysis
M. Ziatdinov, A. Maksov, S.V. Kalinin, Oak Ridge National Laboratory, US
2:35Nanoscale Chemical Imaging with Photo-induced Force Microscopy
S. Park, Molecular Vista Inc., US
2:55Surface Sensing of Atomic Bahavior of Polymer Nanofilms via Molecular Dynamics Simulation
L. Dai, Institute of High Performance computing, SG
Materials CharacterizationExpo Hall D & E
Micro-magnetic properties of nano-magnetites by using magnetic force microscopy
Y-H Chen, National Cheng Kung University, TW
SEM Characterization of Adipose Tissue Structure
V. Brimiene, R. Skaudzius, M. Misevicius, G. Brimas, E. Brimas, A. Kareiva, Vilnius University, LT
Hyphenation of field-flow fractionation and single particle ICP-MS for the assessment of number-based particle size distributions at ultratrace levels
R. Reed, T. Pfaffe, S. Tadjiki, E. Moldenhauer, F. Meier, T. Klein, Postnova Analytics Inc., US
Polypyrrole nanotubes with high electrical conductivity synthesized in the presence of methyl orange
M. Vrňata, D. Kopecký, J. Kopecká, M. Varga, J. Prokeš, M. Václavík, M. Trchová, University of Chemistry and Technology Prague, CZ
Synthesis and characterization of three-dimensional structures of conducting polymer polypyrrole for organic electronic
D. Kopecký, M. Vrňata, J. Kopecká, M. Varga, J. Prokeš, M. Trchová, J. Stejskal, University of Chemistry and Technology Prague, CZ
Comparative HRTEM Examination of Carbon Black and Soot Structures
J.M. Spry, S.P. Compton, MVA Scientific Consultants, US
Optical and Structural Characterization of Nanostructured Zinc Silicate from Rice and Wheat Husks
S.B. Qadri, E.P. Gorzkowski, B.B. Rath, C.R. Feng, R. Amarasinghe, J.A. Freitas, Jr., J.C. Culbertson, J.A. Wollmershauser, U.S. Naval Research Laboratory, US
Preparation and Characterization of Microfibers of Starch Obtained by Electro-Wetspinning
A. Cárdenas William, E. Muñoz Prieto, E.Y. Gómez-Pachón, R. Vera-Graziano, Universidad Pedagógica y Tecnológica de Colombia, CO
Comprehensive characterization of TiO2 nanoparticles using field flow fractionation and multi angle light scattering
S. Tadjiki, R. Reed, F. Meier, T. Klein, Postnova Analytics Inc., US
Metal flux synthesize and atom probe analysis of different Al – Mg phases
M. Khushaim, B. Davaasuren, A. Rothenberger, Taibahu university, SA
Towards Medical Diagnostics Using Hyperspectral X-ray Scatter
C. Greenwood, K. Rogers, M. Wilson, I. Lyburn, P. Evans, G. Davies, Cranfield University, UK
Graphene Moiré Pattern Ultra-High Resolution Atomic Force Microscopy
G. Pascual, B. Kim, K. Lee, Park Systems, US
Advanced Characterization of Nanoporous Gold
A.A. El-Zoka, R.C. Newman, B. Langelier, University of Toronto, CA
The Wear of Cutting Pellets Coated with TiAlN During Machining of a Cobalt Superalloy (FSX-414)
A. Sebhi, N. Douib, University Med Boudiaf M'Sila, UK

Most technological research includes advanced material characterization needs. This event promotes rapid education, dissemination, and commercialization of new characterization techniques into industries based in both physical and life sciences. It seeks to introduce general technique types to newcomers, report pioneering methods, and drill down into new physical understandings, all the while addressing applications useful to industrial engineers and technicians. As can be seen by the list of topics below, all major characterization capabilities are covered including microscopy (electron, optical, scanning probe), spectroscopy, x-ray based methods and hybrid techniques.

Advances in characterization include not only far-field probes (e.g., beams of electrons, ions, neutrons or photons) and near-field probes (indentors, nanotips, fibers and nanotubes), but also a growing intellectual component whereby data are manipulated, analyzed, rendered and simulated to yield meaningful information. As some tools and methods have become more common and practical, certain misunderstandings and misinterpretations also have crept into the lexicon. Besides an element of "methods training" to promote the insightful application of characterization tools in nanotechnology R&D, this symposium will emphasize projects utilizing a spectrum of complementary techniques.

Topics & Application Areas

  • In-Situ/Environmental Characterization: AFM, TEM/SEM, Spectroscopy, X-Ray Based Methods
  • Nanoparticles Characterization: Dimensions, Shape, Concentration, Orientation in a Matrix, Polydispersity, Metrology
  • Composites Characterization: From Nano to Micron Scale
  • Multiscale Structures Characterization in Biotech & Medical Devices
  • Characterization in Pharma & Personal Care
  • Advances in Instrumentation
  • Other

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Korusip
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UCI
University Of Minnesota
UCSB

Supporting Partners
ACCT
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Arrowhead Center
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