I am in the Analytical department of the Stamford CT Research & Innovation Center of the Technology Solutions Business, part of the Solvay Group. Recently I have been developing analytical techniques to characterize the interphase region of carbon fiber/epoxy composite materials. Scanning Probe Microscopy (AFM) and nanoIR are being used to obtain physical property and chemical images of composite cross-sections. I have been in the Analytical Department in Stamford for 37 years, initially as American Cyanamid, then as Cytec Industries and since 2015 as part of Solvay. Over the years I have worked in many analytical techniques including optical microscopy, SEM, TEM, chromatography, polymer characterization, physical chemistry, elemental analysis.