TechConnect Innovation Program

Single Event Upset Suppression System (SEUSS)

Fermi National Accelerator Laboratory, IL, United States

TECHNOLOGY SUMMARY

Single Event Suppression System (SEUSS) cells are designed to be immune to Single Event Upsets (SEU). SEUSS can be configured as two different kinds of SEU-tolerant SR latches. One SEUSS cell emulates a cross-coupled NOR gate SR flip-flop (SEUSSNor). The other one emulates a cross-coupled NAND gate SR flip-flop (SEUSSNand).

Primary Application Area: Electronics, Sensors & Communications

Technology Development Status: Proven Manufacturability

Technology Readiness Level: TRL 8

FIGURES OF MERIT

Value Proposition: SEUSS offers significant economic and performance advantages for Single Event Upset tolerance without loss of design flexibility.

SHOWCASE SUMMARY

Organization Type: Academic/Gov Lab

Showcase Booth #: 627

Website: www.fnal.gov

GOVT/EXTERNAL FUNDING SOURCES

Government Funding/Support to Date: Development of this technology has been funded by the U.S. Department of Energy, Office of Science, Office of High Energy Physics.

Primary Sources of Funding: Federal Grant

Looking for: Development / License Partners