Single Event Upset Suppression System (SEUSS)
Fermi National Accelerator Laboratory, IL, United States
Single Event Suppression System (SEUSS) cells are designed to be immune to Single Event Upsets (SEU). SEUSS can be configured as two different kinds of SEU-tolerant SR latches. One SEUSS cell emulates a cross-coupled NOR gate SR flip-flop (SEUSSNor). The other one emulates a cross-coupled NAND gate SR flip-flop (SEUSSNand).
Primary Application Area: Electronics, Sensors & Communications
Technology Development Status: Proven Manufacturability
Technology Readiness Level: TRL 8
FIGURES OF MERIT
Value Proposition: SEUSS offers significant economic and performance advantages for Single Event Upset tolerance without loss of design flexibility.
Organization Type: Academic/Gov Lab
Showcase Booth #: 627
GOVT/EXTERNAL FUNDING SOURCES
Government Funding/Support to Date: Development of this technology has been funded by the U.S. Department of Energy, Office of Science, Office of High Energy Physics.
Primary Sources of Funding: Federal Grant
Looking for: Development / License Partners