Gapless and Seamless Wafer-Scale Detector System for High Resolution Imaging
Fermi National Accelerator Laboratory, IL, United States
The technology is a pixelated detector system whose basic module size well exceeds that of any currently available device. Its size is equal to that of a full sensor wafer, and the device is completely seamless with no dead zones.
Primary Application Area: Electronics, Sensors & Communications
Technology Development Status: Prototype
Technology Readiness Level: TRL 4
FIGURES OF MERIT
Value Proposition: Ultra high resolution imaging technology using wafer scale pixeelated detector system with no dead zone ensures that critical information is captured cleanly and with a fine degree of detail.
Organization Type: Academic/Gov Lab
Showcase Booth #: 627
GOVT/EXTERNAL FUNDING SOURCES
Government Funding/Support to Date: Research and development is funded by the U.S. Department of Energy, Office of Science, Office of High Energy Phyaics.
Primary Sources of Funding: Federal Grant
Looking for: Both Funding and Development Partners