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Characterizing solid surface nanostructures by UV/Vis/NIR angular resolved transmittance and reflectance measurements
J.L. Taylor
PerkinElmer, US
Keywords: spectroscopy, scatter, transmission, reflection, nanostructures, surface
Summary:
Nanostructures as an integral part of solid surfaces are commonplace in both the biological and commercial products world. This talk will look at how angular resolved UV/Vis/NIR transmission or reflectance measurements can be used to characterize these surfaces or embedded nanostructures in both butterfly wing scales (reflectance) and transparent film samples (transmittance). The measurements were made on a Lambda 1050 UV/Vis/NIR spectrophotometer equipped with two different accessories; the 150 mm integrating sphere with adjustable angle center mount and the automated transmission reflectance accessory (ARTA). These two accessories span a considerable performance and price range. Data will discussed from both accessory configurations and the features and benefits of both types of measurement systems discussed.
