Counting and measuring micro and nano particles by using Fourier Interferometric Imaging

S. Saengkaew, A. Garo, S. Meunier-Guttin-Cluzel, G. Grehan

Keywords: holography, Lorenz-Mie Scattering


The characterization of micro and nano particles suspensions is still a challenge, especially if very low concentration of particles mixtures are concerned. To reach this aim, optical techniques are attractive because they provide a fast answer, are easy to use and inexpensive systems can be developed. However, the strong dependence between the scattered light intensity and the particle diameter (from d6 to d2, according to the particle size relatively to the wavelength) strongly limits the measurement range. In our presentation at Nanotech 2014, we will present a new concept of measurement, called Fourier Interferometric Imaging (FII). This concept is based on the recording of the interference field created by the light scattered by the particles located in the control volume and its processing in the associated 2D FFT space.