Electrical characterization with high spatial resolution of P3HT:PCBM blends used in organic photovoltaics by means of conductive atomic force microscopy

Y.M. Omar, M. Chiesa, A. Al Ghaferi
Masdar Institute, AE

Keywords: organic photovoltaics, conductive atomic force microscopy, P3HT, PCBM

Summary:

Conductive atomic force microscopy was used to characterize P3HT-PCBM blends in the nanoscale with high spatial resolution. Local spectroscopy scans were obtained and charge carrier mobility was determined.