Use of Single Particle Inductively Coupled Plasma Mass Spectrometry to Characterize a New Silver Nanoparticle Reference Material

K.E. Murphy, J. Liu, W.F. Guthrie, J.M. Gorham, J.E. Bonevich, A.J. Allen, M.R. Winchester, V.A. Hackley, R.I. MacCuspie
National Institute of Standards and Technology, US

Keywords: single particle ICP-MS, silver nanoparticles, reference material, particle size, stability


In this study we use a conventional inductively coupled plasma mass spectrometer operated in single particle mode (spICP-MS) to simultaneously characterize the size distribution and dissolved silver fraction of a new candidate silver nanoparticle reference material (NIST RM8017). The candidate RM8017 was prepared as a lyophilized cake of PVP and nominally 75 nm AgNPs that can be reconstituted as a suspension by the addition of deionized water. Particle size distributions obtained via spICP-MS will be compared with transmission electron microscopy (TEM), atomic force microscopy (AFM), and ultra-small angle X-ray scattering (USAX) size measurements. Data on the stability of reconstituted RM8017 stored at 4 oC will be presented.