Some Advances Toward Reliable Measurements of Engineered Nanoparticle Size, Size Distribution, and Number Concentration at the National Institute of Standards and Technology

J. Liu, V.A. Hackley, A.J. Allen
National Institute of Standards and Technology, US

Keywords: DMA, ICP-MS, nanoparticle, number concentration, reference material, size, size distribution, small angle scattering

Summary:

At the National Institute of Standards and Technology (NIST), many approaches for reliable measurements of engineered nanoparticle size, size distribution, and number concentration are being developed. Recent advances in some of these approaches, including differential mobility analysis, inductively coupled plasma mass spectrometry, and small angle scattering, will be explained. The capabilities of these and other techniques for measurements of size, size distribution, and number concentration will be compared. Applications of accurate size measurements to nanoparticle reference materials will be elucidated.