Nanoscale electromagnetic characterization of semiconductors and photovoltaics with scanning microwave microscopy

T. Mitch Wallis

T. Mitch Wallis

Physicist, Electromagnetics Division

National Institute of Standards and Technology

T. Mitch Wallis received his B.S. degree in physics from the Georgia Institute of Technology in 1996 and his M.S. and Ph. D. degrees in physics from Cornell University in 2000 and 2003, respectively. His PhD work focused on the manipulation and characterization of individual atoms and molecules with a scanning tunneling microscope. In 2003, he was awarded a National Research Council postdoctoral fellowship at the National Institute of Standards and Technology (NIST) in Boulder, Colorado. From 2005 to 2007, he held a postdoctoral appointment at Colorado State University. His postdoctoral research focused on the development of metrology for magnetic field imaging based on bi-material cantilevers as well as cantilever-based measurement of magnetomechanical phenomena such as the Einstein-de Haas effect. Since 2007, he has held a position as a physicist at NIST. His current research interests include the development of high-frequency scanning probe microscopes, broadband electrical measurements, and other metrology to enable advances in RF nano-electronics, “beyond-CMOS” devices, and photovoltaics.

Sponsor & Exhibitor Opportunities

Nanotech Conference & Expo  

Microtech Conference & Expo  

Cleantech Conference & Expo  

*Sponsorship Opportunities: Contact Chris Erb

Platinum Sponsor

BASF


Nanotech Platinum Sponsor

Chinano

Association Sponsor

Clean Technology and Sustainable Industries Organization (CTSI)

Producing Sponsors

Nano Science and Technology Institute

TechConnect

TechConnect Acceleration Partners:

BASF
BayerMaterialScience
Battelle
Bosch
bp
Capewell
DOW
GE
Honda
Hyundai
Ingersoll Rand
intel
Lockheed Martin
MWV
Merck
Momentive
National Grid
novaris
Panasonic
PPG
Roche
Sanofi
Shell
siemens
SK Innovation
solvay
Toyota
*Sponsorship Opportunities: Contact Chris Erb

Free Subscription

E-mail:

pbh(); ?>