Technology Committee
Technical Program Co-Chairs
Matthew Laudon, TechConnect
Bart Romanowicz, NSTI
Fiona Case, NSTI
Advisory Committee
Kitu Bindra, Merchant & Gould
Lynn Foster, BPT Pharma
Patti Glaza, Arsenal Venture Partners
Sha-Chelle Manning, Malibu IQ
Brent Segal, Lockheed Martin
Clayton Teague, Former Director, NNCO
Symposia Chairs
Fabrication, Characterization & Tools
Nanoscale Materials Characterization
Greg Haugstad, University of Minnesota, USAPierre Panine, Xenocs SA, FR
Dalia Yablon, Exxon, USA
Modeling & Simulation at the Nanoscale
Michael Makowski, PPG Industries R&D, USANano Fabrication & Manufacturing
Jason Haaheim, NanoInk Inc, USAGuy A. DeRose, California Institute of Technology, USA
Aaron Stein, Brookhaven National Laboratory, USA
Micro and Nano Reliability
Jürgen Keller, AMIC GmbH, DEBernd Michel, Fraunhofer ENAS, DE
Advanced Materials
Carbon Nano Structures and Devices
Wolfgang S. Bacsa, University of Toulouse, FRPhilip G. Collins, University of California, Irvine, USA
Graphene
Bor Jang, Angstron Materials, Inc., USARon Beech, Angstron Materials, Inc., USA
Nanoparticle Synthesis and Application
Sotiris E. Pratsinis, Swiss Federal Institute of Technology, CHLarry Mann, Cabot Supermetals, USA
Composite Materials
Thomas E. Twardowski, Twardowski Scientific, USATinh Nguyen, National Institute of Standards and Technology, USA
Nanofluids
Thomas J. McKrell, Massachusetts Institute of Technology, USALindsay Gill, The Centre for Process Innovation (CPI), UK
Nanostructured Materials and Devices
Fiona Case, NSTI, USAAnupama B. Kaul, National Science Foundation, USA
Nanostructured Coatings Surfaces and Films
Lisa E. Friedersdorf, nanoSTAR Institute, USAKock-Yee Law, Xerox, USA
Polymer Nanotechnology
YuanQiao Rao, Dow Chemical Company, USAFiona Case, NSTI, USA
Soft Nanotech and Colloids
Pat Spicer, Procter & Gamble Company, USATodd Squires, University of California Santa Barbara, USA
Nanomaterials for Catalysis
Pankaj Dhingra, Nanostellar, Inc., USANanomaterials for Clean and Sustainable Technology
Matthew Laudon, NSTI, USAFiona Case, NSTI, USA
Medical & Biotech
Bio Nano Materials
Liz A. Davies, Soft Matter (RSC), USANano Medical Sciences
Khuloud Al-Jamal, King’s College London, UKMaterials for Drug & Gene Delivery
Steven Zullo, NIBIB/NIH, USAInteractions Between Nanomaterials & Living Systems
Kenneth Dawson, University College Dublin, IrelandBiosensing, Diagnostics & Imaging
Srinivas Iyer, Los Alamos National Laboratory, USAJ. Manuel Perez, Nanoscience Technology Center, University of Central Florida, USA
Cancer Nanotechnology
Mansoor M. Amiji, Northeastern University, USAVladimir Torchilin, Northeastern University, USA
Microsystems & Electronics
Power Electronics & Materials
Matthew Laudon, NSTI, USAGreen Electronics
Douglas Keszler, Oregon State University, USAAnupama B. Kaul, National Science Foundation, USA
Modeling & Simulation of Microsystems
Bart Romanowicz, NSTI, USAMicro & Nano Fluidics
Edward Furlani, Kodak, USANano Electronics & Photonics
Bob Doering, Texas Instruments Inc., USAFrank Register, University of Texas, USA
Luigi Colombo, Texas Instruments Inc., USA
MEMS & NEMS Fabrication, Devices & Applications
Elena I. Gaura, Cogent Computing Applied Research Centre, Coventry University, UKInkjet Design Materials and Fabrication
Chris Menzel, Dimatix, Inc., USAWorkshop on Compact Modeling
Xing Zhou, Nanyang Technological University, SGEnergy & Environment
Environmental Health & Safety
Elijah Petersen, National Institute of Standards and Technology, USATinh Nguyen, National Institute of Standards and Technolog, USA
Rashi Iyer, Los Alamos National Laboratory, USA
Solar Power Technologies & Materials
Matt Law, University of California, Irvine, USAEnergy Storage & Novel Generation
Monika Willert-Porada, Universität Bayreuth, DEKristoffer Stokes, Celgard LLC, USA
Oil, Gas, Nuclear & Traditional Energy
Matthew Laudon, NSTI, USABio Sources for Materials & Fuels
James Clark, University of York, UKLucie Pfaltzgraff, Biowaste Industrial Symbiosis Network, UK
Green Chemistry & Materials
Douglas Keszler, Oregon State University, USASchuyler Corry, Invitrogen, USA
James Clark, University of York, UK
Efficiency, Green Building & Construction
George Elvin, Green Technology Forum, USAProgram Review Committee
Adekunle Adeyeye, National University of Singapore, SG
Khuloud al-Jamal, University of London, UK
Mohamed Ansari, Universiti Tenaga Nasional Kajang, Malaysia
Sivaram Arepalli, Sungkyunkwan University, KR
Wolfgang S. Bacsa, University of Toulouse, FR
Stephen Bart, Analog Devices, Inc., USA
Ilker Bayer, Istituto Italiano di Tecnologia , IT
Ron Beech, Angstron Materials, USA
Mark Bernstein, MWW Group, USA
Gregory R. Bogart, Sandia National Laboratories, USA
Martin Case, University of Vermont, USA
Carlo Cavallotti, Politecnico di Milano, IT
Mansun Chan, Hong Kong University of Science & Technology, CN
Charles Kin P. Cheung, NIST, USA
KJ Cho, University of Texas at Dallas, USA
Bum-Kyoo Choi, Sogang University, KR
James Clark, University of York, UK
Philip Collins, University of California, Irvine, USA
Luigi Colombo, Texas Instruments, USA
Zheng Cui, Suzhou Institute of Nanotech, Chinese Academy of Sciences, CN
Liz Davies, Soft Matter (RSC), USA
Guy De Rose, California Institute of Technology, USA
Michael Debije, Eindhoven University of Technology, NT
Bernard Dems, The Dow Chemical Company, USA
Jie Deng, IBM, USA
Pankaj Dhingra, Nanostellar, Inc., USA
Maria Diamanti, Politecnico di Milano, IT
Meenakshi Dutt, University of Pittsburgh, USA
Rutledge Ellis-Behnke, Massachusetts Institute of Technology, USA
George Elvin, Green Technology Forum, USA
Lynn Foster, BPT Pharma, USA
Lisa E. Friedersdorf, NanoSTAR Institute, USA
Edward Furlani, Kodak, USA
Haiyong Gao, University of Connecticut, USA
Elena Gaura, Coventry University, UK
David Giljohann, AuraSense Therapeutics, USA
Gerhard Goldbeck-Wood, Consultant, UK
Alfonso Gonzalez-Monteil, Macro-M, USA
Nadia Grossiord, Holst Center, NT
Zhixiong Guo, Rutgers University, USA
Stacey Harper, Oregon State University, USA
Yousoo Han, University of Maine, USA
Xianghong Hao, Nanosteller, USA
Huixin He, Rutgers University, USA
Michael Helmus, Exponent, USA
Donna Hurley, NIST, USA
Srinivas Iyer, Los Alamos National Laboratory, USA
Mark Jack, Florida A&M University, USA
Anupama Kaul, Jet Propulsion Lab, USA
Jürgen Keller, Fraunhofer Institute for Reliability and Microintegration (IZM), DE
Peter Krueger, Bayer, DE
Andres H. La Rosa, Portland State University, USA
Warren Y.C. Lai, Rutgers University, USA
Jaslyn B.K. Law, Institute of Materials Research and Engineering, SG
Kock-Yee Law, Xerox, USA
Mark E. Law, University of Florida, USA
Adam Lee, Cardiff University, UK
Graham Leggett, Sheffield University, UK
Francois Leonard, Sandia National Laboratories, USA
Khuloud al-Jamal, University of London, UK
Mohamed Ansari, Universiti Tenaga Nasional Kajang, Malaysia
Sivaram Arepalli, Sungkyunkwan University, KR
Wolfgang S. Bacsa, University of Toulouse, FR
Stephen Bart, Analog Devices, Inc., USA
Ilker Bayer, Istituto Italiano di Tecnologia , IT
Ron Beech, Angstron Materials, USA
Mark Bernstein, MWW Group, USA
Gregory R. Bogart, Sandia National Laboratories, USA
Martin Case, University of Vermont, USA
Carlo Cavallotti, Politecnico di Milano, IT
Mansun Chan, Hong Kong University of Science & Technology, CN
Charles Kin P. Cheung, NIST, USA
KJ Cho, University of Texas at Dallas, USA
Bum-Kyoo Choi, Sogang University, KR
James Clark, University of York, UK
Philip Collins, University of California, Irvine, USA
Luigi Colombo, Texas Instruments, USA
Zheng Cui, Suzhou Institute of Nanotech, Chinese Academy of Sciences, CN
Liz Davies, Soft Matter (RSC), USA
Guy De Rose, California Institute of Technology, USA
Michael Debije, Eindhoven University of Technology, NT
Bernard Dems, The Dow Chemical Company, USA
Jie Deng, IBM, USA
Pankaj Dhingra, Nanostellar, Inc., USA
Maria Diamanti, Politecnico di Milano, IT
Meenakshi Dutt, University of Pittsburgh, USA
Rutledge Ellis-Behnke, Massachusetts Institute of Technology, USA
George Elvin, Green Technology Forum, USA
Lynn Foster, BPT Pharma, USA
Lisa E. Friedersdorf, NanoSTAR Institute, USA
Edward Furlani, Kodak, USA
Haiyong Gao, University of Connecticut, USA
Elena Gaura, Coventry University, UK
David Giljohann, AuraSense Therapeutics, USA
Gerhard Goldbeck-Wood, Consultant, UK
Alfonso Gonzalez-Monteil, Macro-M, USA
Nadia Grossiord, Holst Center, NT
Zhixiong Guo, Rutgers University, USA
Stacey Harper, Oregon State University, USA
Yousoo Han, University of Maine, USA
Xianghong Hao, Nanosteller, USA
Huixin He, Rutgers University, USA
Michael Helmus, Exponent, USA
Donna Hurley, NIST, USA
Srinivas Iyer, Los Alamos National Laboratory, USA
Mark Jack, Florida A&M University, USA
Anupama Kaul, Jet Propulsion Lab, USA
Jürgen Keller, Fraunhofer Institute for Reliability and Microintegration (IZM), DE
Peter Krueger, Bayer, DE
Andres H. La Rosa, Portland State University, USA
Warren Y.C. Lai, Rutgers University, USA
Jaslyn B.K. Law, Institute of Materials Research and Engineering, SG
Kock-Yee Law, Xerox, USA
Mark E. Law, University of Florida, USA
Adam Lee, Cardiff University, UK
Graham Leggett, Sheffield University, UK
Francois Leonard, Sandia National Laboratories, USA
Shenggao Liu, ChevronTexaco, USA
Caterina Lo Presti, Merck Serono, IT
Jennifer Lu, University of California, Merced, USA
Katrin Mackenzie, Helmholtz Centre for Environmental Research - UFZ, DE
Larry Mann, Cabot Corporation, USA
Kazunori Matsuda, Tokushima Bunri University, JP
Joey Mead, University of Massachusetts Lowell, USA
Thomas Mele, Applied Materials, USA
Chris Menzel, Dimatix, Inc.
Meyya Meyyappan, National Aeronautics and Space Agency, USA
Bernd Michel, Fraunhofer ENAS, DE
Stephen Minne, Bruker AXS, USA
Charles Motzkus, Laboratoire national de métrologie et d'essais, FR
Andrzej Napieralski, Technical University of Lodz, PL
Tinh Nguyen, National Institute of Standards and Technology, USA
Patricia Nieva, University of Waterloo, CA
Satish Nune, Pacific Northwest National Laboratory, USA
Leonidas E. Ocola, Argonne National Laboratory, USA
Todd Otanicar, Loyola Marymount University, USA
Pierre Panine, European Synchrotron Radiation Facility, FR
Hyung Gyu Park, ETH Zurich, CH
Sunggook Park, Louisiana State University, USA
Elijah Petersen, NIST, USA
Joachim Piprek, NUSOD Institute, USA
Sotiris E. Pratsinis, Swiss Federal Institute of Technology, CH
Roger Proksch, Asylum Research, USA
Serge Prudhomme, University of Texas at Austin, USA
YuanQiao Rao, The Dow Chemical Company, USA
Mark Reed, Yale University, USA
Erik Reimhult, Universität für Bodenkultur Wien, AT
Bart Romanowicz, NSTI, USA
Robert Rudd, Lawrence Livermore National Laboratory, USA
Richard Sadus, Swinburne University of Technology, AU
Tuhin Sahai, Cornell University, USA
Siegfried Selberherr, Technical University of Vienna, AT
Neeraj Sharma, 3M, USA
Pat Spicer, Procter & Gamble Company, USA
Aaron Stein, Brookhaven National Laboratory, USA
Anna Stradner, University of Freiburg, CH
Donald C. Sundberg, University of New Hampshire, USA
Sarah Tao, Consultant, USA
Clayton Teague, National Nanotechnology Coordination Office, USA
Colby Shad Thaxton, Northwestern University, USA
Treye Thomas, Consumer Protection Safety Commission, USA
Thomas E. Twardowski, Twardowski Scientific, USA
Jan Van Hest, Ramboud University, NT
Dragica Vasilesca, Arizona State University, USA
Anand Vasudev, Applied Materials, USA
Armin R. Volkel, Palo Alto Research Center
Yang Wang, South China Normal University, CN
Josef Watts, IBM, USA
Monika Willert-Porada, Universität Bayreuth, DE
Cy Wilson, North American Space Agency, USA
Wendel Wohlleben, BASF, USA
Gayle Woloschak, Northwestern University, USA
Dalia Yablon, ExxonMobil Research and Engineering, USA
Xing Zhou, Nanyang Technological University, SG
Steve Zullo, NIH/NIBIB, USA
Caterina Lo Presti, Merck Serono, IT
Jennifer Lu, University of California, Merced, USA
Katrin Mackenzie, Helmholtz Centre for Environmental Research - UFZ, DE
Larry Mann, Cabot Corporation, USA
Kazunori Matsuda, Tokushima Bunri University, JP
Joey Mead, University of Massachusetts Lowell, USA
Thomas Mele, Applied Materials, USA
Chris Menzel, Dimatix, Inc.
Meyya Meyyappan, National Aeronautics and Space Agency, USA
Bernd Michel, Fraunhofer ENAS, DE
Stephen Minne, Bruker AXS, USA
Charles Motzkus, Laboratoire national de métrologie et d'essais, FR
Andrzej Napieralski, Technical University of Lodz, PL
Tinh Nguyen, National Institute of Standards and Technology, USA
Patricia Nieva, University of Waterloo, CA
Satish Nune, Pacific Northwest National Laboratory, USA
Leonidas E. Ocola, Argonne National Laboratory, USA
Todd Otanicar, Loyola Marymount University, USA
Pierre Panine, European Synchrotron Radiation Facility, FR
Hyung Gyu Park, ETH Zurich, CH
Sunggook Park, Louisiana State University, USA
Elijah Petersen, NIST, USA
Joachim Piprek, NUSOD Institute, USA
Sotiris E. Pratsinis, Swiss Federal Institute of Technology, CH
Roger Proksch, Asylum Research, USA
Serge Prudhomme, University of Texas at Austin, USA
YuanQiao Rao, The Dow Chemical Company, USA
Mark Reed, Yale University, USA
Erik Reimhult, Universität für Bodenkultur Wien, AT
Bart Romanowicz, NSTI, USA
Robert Rudd, Lawrence Livermore National Laboratory, USA
Richard Sadus, Swinburne University of Technology, AU
Tuhin Sahai, Cornell University, USA
Siegfried Selberherr, Technical University of Vienna, AT
Neeraj Sharma, 3M, USA
Pat Spicer, Procter & Gamble Company, USA
Aaron Stein, Brookhaven National Laboratory, USA
Anna Stradner, University of Freiburg, CH
Donald C. Sundberg, University of New Hampshire, USA
Sarah Tao, Consultant, USA
Clayton Teague, National Nanotechnology Coordination Office, USA
Colby Shad Thaxton, Northwestern University, USA
Treye Thomas, Consumer Protection Safety Commission, USA
Thomas E. Twardowski, Twardowski Scientific, USA
Jan Van Hest, Ramboud University, NT
Dragica Vasilesca, Arizona State University, USA
Anand Vasudev, Applied Materials, USA
Armin R. Volkel, Palo Alto Research Center
Yang Wang, South China Normal University, CN
Josef Watts, IBM, USA
Monika Willert-Porada, Universität Bayreuth, DE
Cy Wilson, North American Space Agency, USA
Wendel Wohlleben, BASF, USA
Gayle Woloschak, Northwestern University, USA
Dalia Yablon, ExxonMobil Research and Engineering, USA
Xing Zhou, Nanyang Technological University, SG
Steve Zullo, NIH/NIBIB, USA
