Nanostructured Material Characterization by X-ray Diffraction

S. Rekhi, K. Macchiarola, B. Litteer
PANalytical Inc., US

Keywords: nanomaterials, small angle scattering, pair distribution function

Summary:

The presentation will review various applications such as X-ray diffraction, Small angle scattering and Pair distribution Function analysis to determine structural features of nanocrystalline materials