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Motivations for a common MEMS test methodology

Don  Feuerstein

Don Feuerstein

Vice President

SemiProbe, Inc.

Don Feuerstein was a founding partner of SemiProbe, Inc.; innovator of the patented Probe System for Life - a modular approach to building wafer probing and inspection equipment. Don, active in MEMS test and characterization for many years, has been a speaker at Industry symposiums such as the Napa Known Good Die Conference, Semicon West and the Sensors Conference in Rosemont, Illinois. As a published author, his articles on MEMS test have been published in such esteemed journals as Evaluation Engineering and The MEPTEC Report. Don is a patent holder on 2 wafer level test systems, and is recognized as the designer on many additional test accessories. He earned his bachelors degree at Northeastern University and his Masters at the University of New Haven. Active in his community, Don was the founder of the Tribury Jaycees and Southbury Soccer a youth sports organization.


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