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Nanoporous thin-film waveguide resonance sensors with wavelength interrogation over a broad bandwidth

Z-M Qi, Z. Zhang, Q. Liu, D. Lu
Institute of Electronics, Chinese Academy of Sciences, CN

Keywords: nanoporous thin-film waveguide, resonance wavelength, ultrahigh sensitivity

Abstract:

Nanoporous dielectric film based leaky-mode waveguide resonance sensors have attracted considerable attention because of their interesting features [1-4]. Such sensors generally operate in the angular interrogation mode [1-3]. The first application of the wavelength interrogation mode to nanoporous waveguide resonance sensors was demonstrated in our previous work [4]. This study shows the new results obtained most recently using the wavelength-interrogating nanoporous waveguide resonance sensor. The sensor is able to detect CTAB (a small-molecule surfactant) in the aqueous solution (Fig 2). A small increase in refractive index (RI) of the surrounding liquid can also result in a large blue shift in the resonance wavelength of the sensor (Fig.3). In this case, the RI sensitivity of the sensor is much larger than that of a conventional SPR sensor with a naked gold layer [5].
 
 
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