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Nanoscale Characterization Techniques and Applications

Greg Haugstad

Greg Haugstad

Senior Research Associate and Director, Characterization Facility

University of Minnesota and NSF Materials Research Facilities Network

Greg Haugstad is technical staff member and director of the Characterization Facility (“CharFac”;, a core facility at the University of Minnesota. The CharFac is closely affiliated with the University’s (1) NSF Materials Research Science and Engineering Center, especially as a member of the national-reach Materials Research Facilities Network (, and (2) Industrial Partnership for Research in Interfacial and Materials Engineering ( Dr. Haugstad received his B.A. in physics from Gustavus Adolphus College and Ph.D. in physics from the University of Minnesota. His doctoral research explored metal-semiconductor interfaces with synchrotron radiation and cryogenic methods. After postdoctoral research with DuPont in the University’s NSF Center for Interfacial Engineering, he joined the CharFac in 1994. In this role his technique focus includes atomic force microscopy (AFM), ion beam analysis (Rutherford backscattering and related) and time-of-flight secondary ion mass spectrometry. His teaching has included curricular courses at PhD, undergraduate, and technical-college levels, as well as ~500 user trainings and several local and national-reach short courses. He is also a member of the graduate faculty, serving as thesis co-adviser within the materials science and chemistry programs, and currently a PI in NSF-funded research on organic semiconductors.

Greg's research program includes thrusts in (i) special AFM methods, (ii) nanotribology, (iii) thin films (polymer, surfactant, biological), and (iv) drug release coatings / pharmaceutics. He has over seventy publications and is a frequent participant in multidisciplinary symposia and workshops with the common thread of AFM methods. His industrial collaboration and consulting has included companies spanning medical imaging, aviation devices, personal care products, ocular materials, medical device coatings and analytical instrumentation.

Teaching the workshop on Nanoscale Characterization Techniques and Applications.

Co-chairing the special symposium on Nanoscale Characterization.

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