TechConnect World 2018
Co-Located with Nanotech 2018 SBIR/STTR Spring Defense TechConnect
Nanotech 2018

Materials Characterization & Imaging

Nanoscale Materials Characterization

Abstracts Due: January 19, 2018

Symposium Co-Chairs

Pierre PaninePierre Panine
Senior Scientist
Xenocs SA, France

Greg  HaugstadGreg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota

Dalia YablonDalia Yablon
SurfaceChar LLC

Key Speakers

Sung ParkPhoto-induced force microscopy: a technique for hyperspectral nanochemical mapping
Sung Park
CEO, Molecular Vista

James GimzewskiJames Gimzewski
Professor, Director Nano & Pico Characterization Lab
University of California, Los Angeles

Kevin KjollerKevin Kjoller
Vice President
Anasys Instruments

Thuc-Quyen  NguyenNanoscale Characterization of Solar Cells by Conductive and Photoconductive Atomic Force Microscopy
Thuc-Quyen Nguyen
Professor, Department of Chemistry and Biochemistry, University of California, Santa Barbara

Most technological research includes advanced material characterization needs. This event promotes rapid education, dissemination, and commercialization of new characterization techniques into industries based in both physical and life sciences. It seeks to introduce general technique types to newcomers, report pioneering methods, and drill down into new physical understandings, all the while addressing applications useful to industrial engineers and technicians. As can be seen by the list of topics below, all major characterization capabilities are covered including microscopy (electron, optical, scanning probe), spectroscopy, x-ray based methods and hybrid techniques.

Advances in characterization include not only far-field probes (e.g., beams of electrons, ions, neutrons or photons) and near-field probes (indentors, nanotips, fibers and nanotubes), but also a growing intellectual component whereby data are manipulated, analyzed, rendered and simulated to yield meaningful information. As some tools and methods have become more common and practical, certain misunderstandings and misinterpretations also have crept into the lexicon. Besides an element of "methods training" to promote the insightful application of characterization tools in nanotechnology R&D, this symposium will emphasize projects utilizing a spectrum of complementary techniques.

Submit Your Abstract

Please first review the information for authors — abstract submission guidelines.


Topics & Application Areas

  • Composites Characterization: From Nano to Micron Scale
  • Near-Surface Characterization & Functionalization:  Thin Films & Coatings, Soft Matter Photovoltaics, Dewetting, Adhesion, Tribology
  • Mesoporous Materials & Catalysts for Energy Applications
  • Morphology in Polymer-Based Technologies: Crystallization, Phase Segregation, Thermal Behavior, Gelation, Networks
  • Correlative Techniques and In-Situ Characterization
  • Advances in Instrumentation
  • Other
2017 Sponsors & Partners
2017 Sponsors & Partners

TechConnect World 2018

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