TechConnect World 2018
Co-Located with Nanotech 2018 SBIR/STTR Spring Defense TechConnect
Nanotech 2018
 

Materials Characterization & Imaging

Nanoscale Materials Characterization

First Call Abstracts Due: December 08, 2017

Symposium Co-Chairs

Pierre PaninePierre Panine
Senior Scientist
Xenocs SA, France

Greg HaugstadGreg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota

Dalia YablonDalia Yablon
Founder
SurfaceChar LLC

Key Speakers

Sung ParkPhoto-induced force microscopy: a technique for hyperspectral nanochemical mapping
Sung Park
CEO, Molecular Vista

Most technological research includes advanced material characterization needs. This event promotes rapid education, dissemination, and commercialization of new characterization techniques into industries based in both physical and life sciences. It seeks to introduce general technique types to newcomers, report pioneering methods, and drill down into new physical understandings, all the while addressing applications useful to industrial engineers and technicians. As can be seen by the list of topics below, all major characterization capabilities are covered including microscopy (electron, optical, scanning probe), spectroscopy, x-ray based methods and hybrid techniques.

Advances in characterization include not only far-field probes (e.g., beams of electrons, ions, neutrons or photons) and near-field probes (indentors, nanotips, fibers and nanotubes), but also a growing intellectual component whereby data are manipulated, analyzed, rendered and simulated to yield meaningful information. As some tools and methods have become more common and practical, certain misunderstandings and misinterpretations also have crept into the lexicon. Besides an element of "methods training" to promote the insightful application of characterization tools in nanotechnology R&D, this symposium will emphasize projects utilizing a spectrum of complementary techniques.

Submit Your Abstract

Please first review the information for authors — abstract submission guidelines.

 

Topics & Application Areas

  • Nanoparticles Characterization: Dimensions, Shape, Concentration, Orientation in a Matrix, Polydispersity, Metrology
  • Composites Characterization: From Nano to Micron Scale
  • Near-Surface Characterization & Functionalization:  Thin Films & Coatings, Soft Matter Photovoltaics, Dewetting, Adhesion, Tribology
  • Mesoporous Materials & Catalysts for Energy Applications
  • Morphology in Polymer-Based Technologies: Crystallization, Phase Segregation, Thermal Behavior, Gelation, Networks
  • Correlative Techniques and In-Situ Characterization
  • Advances in Instrumentation
  • Other
 
2017 Sponsors & Partners
2017 Sponsors & Partners

TechConnect World 2018

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