First Call Abstracts Due: December 08, 2017
Most technological research includes advanced material characterization needs. This event promotes rapid education, dissemination, and commercialization of new characterization techniques into industries based in both physical and life sciences. It seeks to introduce general technique types to newcomers, report pioneering methods, and drill down into new physical understandings, all the while addressing applications useful to industrial engineers and technicians. As can be seen by the list of topics below, all major characterization capabilities are covered including microscopy (electron, optical, scanning probe), spectroscopy, x-ray based methods and hybrid techniques.
Advances in characterization include not only far-field probes (e.g., beams of electrons, ions, neutrons or photons) and near-field probes (indentors, nanotips, fibers and nanotubes), but also a growing intellectual component whereby data are manipulated, analyzed, rendered and simulated to yield meaningful information. As some tools and methods have become more common and practical, certain misunderstandings and misinterpretations also have crept into the lexicon. Besides an element of "methods training" to promote the insightful application of characterization tools in nanotechnology R&D, this symposium will emphasize projects utilizing a spectrum of complementary techniques.
Please first review the information for authors — abstract submission guidelines.