TechConnect World 2017
National SBIR/STTR Conference National Innovation Summit & Showcase Nanotech 2016
Nanotech 2017
 

Materials Characterization & Imaging

Nanoscale Materials Characterization

Submit Poster Abstract - due March 31

Please first review the information for authors — abstract submission guidelines.

Symposium Co-Chairs

Pierre PaninePierre Panine
Senior Scientist
Xenocs SA, France

Greg HaugstadGreg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota

Dalia YablonDalia Yablon
Founder
SurfaceChar LLC

Key Speakers

Ryan WagnerReconstruction of the Distributed Force on an Atomic Force Microscope Cantilever
Ryan Wagner
Mechanical Engineer, National Institute of Standards and Technology

Canhui WangHybrid transmission electron microscope: An integrated platform for in situ imaging and spectroscopies
Canhui Wang
Postdoctoral Researcher, CNST/UMD, National Institute of Standards and Technology

Edward NelsonAFSEM™ - correlative in situ atomic force microscopy in electron and ion beam microscopes
Edward Nelson
Nanosurf Inc

Song XuIn-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force micrscope
Song Xu
Sr. Application Scientist, Keysight Technologies

Bede PittengerToward improved accuracy in nanomechanical measurements with Atomic Force Microscopy
Bede Pittenger
Applications Scientist, Bruker Corporation

Byeongdu LeeIn situ X-ray scattering studies of nanomaterials for energy
Byeongdu Lee
Physicist, Chemical and Materials Science, Argonne National Laboratory

Roger ProkschRoger Proksch
President
Asylum Research, an Oxford Instruments Company

Byong KimGraphene Moiré Pattern Ultra-High Resolution Atomic Force Microscopy
Byong Kim
Applications Group Director, Park Systems


Symposium Sessions

Monday May 15

10:30Materials for Personal/Home Care & Cosmetics
1:30Nanoparticle Characterization

Tuesday May 16

10:30Nanoparticles for Imaging & Diagnostics
1:30Characterizing Materials In Situ

Wednesday May 17

8:30Characterizing Materials using AFM I
1:30Characterizing Materials using AFM II
Materials Characterization: Posters

Symposium Program

Monday May 15

10:30Materials for Personal/Home Care & Cosmetics
Session chair: Prithwiraj Maitra, Johnson and Johnson, US
10:30Innovative Materials for Personal/Home Care & Cosmetics (invited presentation)
M. de Mul, BASF, US
10:55Simultaneous Small Angle and Wide Angle X-ray Scattering (SAXS/WAXS) for the Characterization of Nanostructure in Personal Care, Cosmetic, and Food Products. (invited presentation)
S. Barton, SAXSLAB, US
11:20TBA (invited presentation)
S. Amin, L'Oreal Americas, US
11:45Controlled release of hydrogen peroxide encapsulated in silica nanoparticles for application in the washing process and in antimicrobial textiles
J. Rocha-Gomes, D. Pereira, University of Minho, PT
12:05Easy-to-use, Portable and Inexpensive Nano-Engineered Sensor for the Authentification of Cosmetic and Food Products
A. Othman, X. Zou, L. Norton, S. Andreescu, Clarkson University, US
1:30Nanoparticle Characterization
1:30Quantitative Analysis of Oxidation State in Cerium Oxide Nanomaterials
C.M. Sims, R.A. Maier, A.C. Johnston-Peck, J.M. Gorham, V.A. Hackley, B.C. Nelson, National Institute of Standards and Technology, US
1:50Development and Characterization of Commercial Boron Nitride Nanotube Product Forms
M.B. Jakubinek, Y. Martinez-Rubi, K.S. Kim, Z.J. Jakubek, C.M. Homenick, S. Zou, D. Klug, B. Ashrafi, J. Guan, S. Walker, M. Daroszewska, C.T. Kingston, B. Simard, National Research Council Canada, CA
2:10Assessing Drug Encapsulation Efficiency using Nanoparticle Tracking Analysis
R. Ragheb, D. Griffiths, Malvern Instrument, US
2:30FibriPy: a software environment for fiber analysis from 3D micro-computed tomography data
T. Perciano, D. Ushizima, H. Krishnan, J. Sethian, Lawrence Berkeley National Laboratory, US
2:50Nanotrap-enhanced mass spectrometry: direct detection of pathogen antigens in the urine of animal models and human patients affected by tick borne diseases
R. Magni, K. Jackson, R. Molestina, B. Kim, J. Walsh, B. Lepene, R. Dunlap, L. Liotta, A. Luchini, George Mason University, US
3:10Calibration Devices for Optical Microscopy at Subnanometer Scales
C.R. Copeland, J.A. Liddle, C.D. McGray, J. Geist, B.R. Ilic, S.M. Stavis, National Institute of Standards and Technology, US
3:30How to Caracterize Soft Nanoparticles
L. Calzolai, P. Urban, P. Iavicoli, European Commission- DG Joint Research Centre, IT

Tuesday May 16

10:30Nanoparticles for Imaging & Diagnostics
Session chair: Dalia Yablon, SurfaceChar LLC, US
10:30Nanoparticle Imaging Probes for Molecular Imaging with Computed Tomography (invited presentation)
R. Roeder, University of Notre Dame, US
10:55Novel fluorescent nanoparticles for ultrasensitive identification of nucleic acids by optical methods
M. Westergaard Mulberg, M. Taskova, A. Okholm, J. Kjems, K. Astakhova, University of Southern Denmark, DK
11:15Double functionalization of magnetic colloids with electroactive molecules and antibody for platelet detection and separation
F. Chen, N. Haddour, M. Frenea-Robin, Y. Mérieux, Y. Chevolot, V. Monnier, Institut des Nanotechnologies de Lyon, FR
11:35Printable Field Deployable Sensors based on Functional Redox Active Nanoparticles
A. Othman, S. Andreescu, Clarkson University, US
11:55Non–enzymatic electrochemical sensing platforms using –cyclodextrin and multi–walled carbon nanotubes for selective detection of uric acid
M.B. Wayu, M.A. Schwarzmann, S.D. Gillespie, M.C. Leopold, University of Richmond, US
12:15Pore Size and its Effect on Molybdenum Retention in Mesoporous Alumina
R. Hepburn, S. Tsubota, Fujimi Corporation, US
1:30Characterizing Materials In Situ
1:30Hybrid transmission electron microscope: An integrated platform for in situ imaging and spectroscopies (invited presentation)
C. Wang, W-C Yang, R. Sharma, National Institute of Standards and Technology, US
1:55Nanofluidic Liquid Cell with Integrated Electrokinetic Pump for In Situ TEM
C.H. Ray, B.R. Ilic, R. Sharma, G. Holland, V. Aksyuk, S.M. Stavis, J.A. Liddle, National Institute of Standards and Technology, US
2:15In situ TEM/STEM of the Coarsening of Nanoporous Gold
A.A. El-Zoka, J. Howe, R.C. Newman, D. Perovic, University of Toronto, CA
2:35Probing Nanoscale Composites, Interfaces, and Damage Gradients with In-Situ and Ex-Situ Multiscale Mechanical Methodologies
N.A. Mara, Los Alamos National Laboratory, US
2:55In situ X-ray scattering studies of nanomaterials for energy (invited presentation)
B. Lee, Argonne National Laboratory, US
3:20In situ Rheology with Small Angle x-ray Scattering and x-ray Photon Correlation Spectroscopy
X-M Lin, J. Lee, Z. Jiang, J. Wang, A.R. Sandy, S. Narayanan, Argonne National Laboratory, US
3:40In-situ Investigation of Metal Corrosion and Corrosion-Resistant Coatings by Micro-Beam X-ray Spectroscopy and Electron Microscopy
K. Chen-Wiegart, M. Ge, G. Williams, E. Nazaretsky, Y. Chu, J. Thieme, K. Kisslinger, E.A. Stach, H. Jiang, K. Foster, D. Vonk, KW. Chou, S. Petrash, Henkel Corporation, US

Wednesday May 17

8:30Characterizing Materials using AFM I
8:30Reconstruction of the Distributed Force on an Atomic Force Microscope Cantilever (invited presentation)
R. Wagner, National Institute of Standards and Technology, US
8:55AFSEM™ - correlative in situ atomic force microscopy in electron and ion beam microscopes (invited presentation)
E. Nelson, Nanosurf, inc., US
9:20TBA (invited presentation)
R. Proksch, Asylum Research, US
9:45In-situ and real time study of SEI formation on anode in a Lithium battery cell using atomic force micrscope (invited presentation)
S. Xu, Keysight Technologies, US
10:10Graphene Moiré Pattern Ultra-High Resolution Atomic Force Microscopy (invited presentation)
B. Kim, Park Systems, US
1:30Characterizing Materials using AFM II
1:30Toward improved accuracy in nanomechanical measurements with Atomic Force Microscopy (invited presentation)
B. Pittenger, S. Hu, J. Mosley, L. Huang, J. He, P. Dewolf, Bruker Corporation, US
1:55G-Mode KPFM: Bringing Kelvin probe force microscopy into the information age
L. Collins, S. Kalinin, S. Jesse, Oak Ridge National Laboratory, US
2:15Learning the Physics and Chemistry of Surfaces via Machine Vision and Deep Data Analysis
M. Ziatdinov, A. Maksov, S.V. Kalinin, Oak Ridge National Laboratory, US
2:35Nanoscale Chemical Imaging with Photo-induced Force Microscopy
S. Park, Molecular Vista Inc., US
2:55Surface Sensing of Atomic Bahavior of Polymer Nanofilms via Molecular Dynamics Simulation
L. Dai, Institute of High Performance computing, SG
Materials Characterization: PostersPotomac Registration Hall
SEM Characterization of Adipose Tissue Structure
V. Brimiene, R. Skaudzius, M. Misevicius, G. Brimas, E. Brimas, A. Kareiva, Vilnius University, LT
Admittance, Impedance, and Modulus Spectroscopy Study of ZnO-Zn2BiVO6-Mn3O4 Ceramics
Y W. Hong, Y.B. Kim, S.Y. Yeo, J.H. Paik, J.H. Cho, Y.H. Jeong, J.S. Yun, W.I. Park, Korea Institute of Ceramic Engineering and Technology, KR
Hyphenation of field-flow fractionation and single particle ICP-MS for the assessment of number-based particle size distributions at ultratrace levels
R. Reed, T. Pfaffe, S. Tadjiki, E. Moldenhauer, F. Meier, T. Klein, Postnova Analytics Inc., US
Polypyrrole nanotubes with high electrical conductivity synthesized in the presence of methyl orange
M. Vrňata, D. Kopecký, J. Kopecká, M. Varga, J. Prokeš, M. Václavík, M. Trchová, University of Chemistry and Technology Prague, CZ
Synthesis and characterization of three-dimensional structures of conducting polymer polypyrrole for organic electronic
D. Kopecký, M. Vrňata, J. Kopecká, M. Varga, J. Prokeš, M. Trchová, J. Stejskal, University of Chemistry and Technology Prague, CZ
Comparative HRTEM Examination of Carbon Black and Soot Structures
J.M. Spry, S.P. Compton, MVA Scientific Consultants, US
Optical and Structural Characterization of Nanostructured Zinc Silicate from Rice and Wheat Husks
S.B. Qadri, E.P. Gorzkowski, B.B. Rath, C.R. Feng, R. Amarasinghe, J.A. Freitas, Jr., J.C. Culbertson, J.A. Wollmershauser, U.S. Naval Research Laboratory, US
Characterization of Nanoparticle Concentration in Complex Drugs by Microdroplet Deposition and Optical Microscopy
J. Myung, L.C. Elliott, S.M. Stavis, J. Zheng, D. Kozak, FDA, US
Preparation and Characterization of Microfibers of Starch Obtained by Electro-Wetspinning
A. Cárdenas William, E. Muñoz Prieto, E.Y. Gómez-Pachón, R. Vera-Graziano, Universidad Pedagógica y Tecnológica de Colombia, CO
Comprehensive characterization of TiO2 nanoparticles using field flow fractionation and multi angle light scattering
S. Tadjiki, R. Reed, F. Meier, T. Klein, Postnova Analytics Inc., US
Metal flux synthesize and atom probe analysis of different Al – Mg phases
M. Khushaim, B. Davaasuren, A. Rothenberger, Taibahu university, SA
Towards Medical Diagnostics Using Hyperspectral X-ray Scatter
C. Greenwood, K. Rogers, M. Wilson, I. Lyburn, P. Evans, G. Davies, Cranfield University, UK
Advanced Characterization of Nanoporous Gold
A.A. El-Zoka, R.C. Newman, B. Langelier, University of Toronto, CA
The Wear of Cutting Pellets Coated with TiAlN During Machining of a Cobalt Superalloy (FSX-414)
A. Sebhi, N. Douib, University Med Boudiaf M'Sila, UK

Most technological research includes advanced material characterization needs. This event promotes rapid education, dissemination, and commercialization of new characterization techniques into industries based in both physical and life sciences. It seeks to introduce general technique types to newcomers, report pioneering methods, and drill down into new physical understandings, all the while addressing applications useful to industrial engineers and technicians. As can be seen by the list of topics below, all major characterization capabilities are covered including microscopy (electron, optical, scanning probe), spectroscopy, x-ray based methods and hybrid techniques.

Advances in characterization include not only far-field probes (e.g., beams of electrons, ions, neutrons or photons) and near-field probes (indentors, nanotips, fibers and nanotubes), but also a growing intellectual component whereby data are manipulated, analyzed, rendered and simulated to yield meaningful information. As some tools and methods have become more common and practical, certain misunderstandings and misinterpretations also have crept into the lexicon. Besides an element of "methods training" to promote the insightful application of characterization tools in nanotechnology R&D, this symposium will emphasize projects utilizing a spectrum of complementary techniques.

Topics & Application Areas

  • In-Situ/Environmental Characterization: AFM, TEM/SEM, Spectroscopy, X-Ray Based Methods
  • Nanoparticles Characterization: Dimensions, Shape, Concentration, Orientation in a Matrix, Polydispersity, Metrology
  • Composites Characterization: From Nano to Micron Scale
  • Multiscale Structures Characterization in Biotech & Medical Devices
  • Characterization in Pharma & Personal Care
  • Advances in Instrumentation
  • Other

Sponsor & Exhibitor Opportunities

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Platinum Sponsors
Korusip
Lockheed Martin
NSTXL

Silver Sponsors
Fujifilm
TechOpp

Corporate Acceleration Partners
Aerojet
Arkema
Boeing
Church & Dwight
Corning
Cummins
Eastman Chemical
Evonik
Henkel
Huntsman
Ingersoll_Rand
LG
Lockheed Martin
LOreal
Magna
Michelman
Owens Corning
Panasonic
Praxair
Sabic
SAINT-GOBAIN
Shell
Sherwin Williams
UTC

Technology Development Partners
 
Argonne
Business Sweden
ceatech
Clemson University
Innovate Hawaii
InvestInSkane
Iowa State University
korusip
KYUNGPOOK National University
NASA
New Jersey Innovation Institute
PolyU
SungKyunKwan University
UCI
University Of Melbourne
University Of Minnesota
University Of Vermont
UCSB
Vermont Department Economic Development
Vermont Technology Council

Supporting Partners
ACCT
American Elements
Angel Capital Associates
AOCS
Arrowhead Center
Asia Nano Forum
AURP
AUTM
Coatings
Diplomacy Matters
Explore Nano
FCHEA
FLC
Graphene Council
InterNano
Journal of Nanobiotechnology
LES
NVCA
NCURA
NECEC
SBIR
SBDC
Taylor Francis CRC
Texas Nanotech Initiative
Texas Tech University ORC.gif
UIDP

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