Nanoscale Materials Characterization

Symposium Co-Chairs

Pierre PaninePierre Panine
Senior Scientist
Xenocs SA, France
Greg HaugstadGreg Haugstad
Technical Staff Member & Director, Characterization Facility (CharFac)
University of Minnesota
Dalia YablonDalia Yablon
SurfaceChar LLC

Confirmed Invited Speakers

Eric J. AmisManufacturing: The 21st Century Nano Materials Challenge
Eric J. Amis
Director, Physical Sciences, United Technologies Research Center
Andy TsouBimodal AFM for Elucidation of Polyolefin Morphology
Andy Tsou
Researcher, ExxonMobil Chemical Company
James F  RanvilleCharacterization of Complex Inorganic Nanoparticles by FFF-ICP-MS and Single Particle ICP-MS
James F Ranville
Professor, Department of Chemistry & Geochemistry, Colorado School of Mines
Peter  HoghojSizing Nanoparticles with X-Rays
Peter Hoghoj
CEO, Xenocs, France
Wendel WohllebenAdventures in number metrics: Regulatory nanodefinitions applied to large portfolios containing small particles
Wendel Wohlleben
Researcher, BASF Advanced Materials, Germany
Luigi  CalzolaiLuigi Calzolai
IHCP, Joint Research Centre
European Commission, Italy
Nicholas FeltinDevelopment of a new method for the traceability of the nanoparticle size measurements by AFM and SEM
Nicholas Feltin
Responsible of the Nanometrology Platform, National Laboratory of Metrology and Tests, France
Jingyu LiuJingyu Liu
Postdoctoral Research Associate
National Institute of Standards and Technology (NIST)

Symposium Sessions

Monday June 16

11:00Nanoparticle Sizing & Counting I
1:30Nanoparticle Sizing & Counting II
Nanoscale Materials Characterization I - Posters 4:30

Tuesday June 17

10:30The Importance of Characterization to Technology: Keynotes
Nanoscale Materials Characterization II - Posters 1:30
3:00Nanoscale Materials Characterization

Wednesday June 18

10:30Nanoscale Materials Characterization II
2:00Nanoscale Materials Characterization: Vendors
Nanoscale Materials Characterization III - Posters 4:00

Symposium Program

Monday June 16

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11:00Nanoparticle Sizing & Counting IChesapeake 8-9
Session chair: Pierre Panine, Xenocs SA, France (bio)
11:00Adventures in number metrics: Regulatory nanodefinitions applied to large portfolios containing small particles (invited presentation)
W. Wohlleben, P. Mueller, BASF SE, DE (bio)
11:25Sizing Nanoparticles with X-Rays (invited presentation)
P. Hoghoj, S. Desvergne-Blenau, F. Bossan, M. Fernandez-Martinez, B. Lantz, R. Mahe, P. Panine, S. Rodrigues, Xenocs, FR (bio)
11:50Some Advances Toward Reliable Measurements of Engineered Nanoparticle Size, Size Distribution, and Number Concentration at the National Institute of Standards and Technology (invited presentation)
J. Liu, V.A. Hackley, A.J. Allen, National Institute of Standards and Technology, US (bio)
12:15Characterization of Complex Inorganic Nanoparticles by FFF-ICP-MS and Single Particle ICP-MS (invited presentation)
J.F. Ranville, M. Montano, H. Badiei, Colorado School of Mines, US (bio)
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1:30Nanoparticle Sizing & Counting IIChesapeake 8-9
Session chair: Pierre Panine, Xenocs SA, France (bio)
1:30Methods to Measure the Particle Size Distribution of Nanoparticles in Complex Matrices (invited presentation)
L. Calzolai, D. Gilliland, F. Rossi, Joint Research Center. European Commission, IT (bio)
1:55Development of a new method for the traceability of the nanoparticle size measurements by AFM and SEM (invited presentation)
N. Feltin, A. Delvallée, S. Ducourtieux, C. Ulysse, Laboratoire national de métrologie et d'essais, FR (bio)
2:20Counting and measuring micro and nano particles by using Fourier Interferometric Imaging
S. Saengkaew, A. Garo, S. Meunier-Guttin-Cluzel, G. Grehan, UMR CNRS 6614/CORIA, FR
2:40Evaluation of the potential of single particle ICP-MS to assess the influence of the coating on the stability of AuNPs
A.R. Montoro Bustos, M.R. Winchester, E.J. Petersen, National Institute of Standards and Technology, US
3:00Monitoring Strategy for Characterization of Airborne Nanoparticles
J. Niu, P. Rasmussen, R. Magee, G. Nilsson, Health Canada, CA
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Nanoscale Materials Characterization I - Posters 4:30Expo Hall C
-X-ray Reflectometry of Planar Nanoheterostructures:a New Model-less Approach
V.V. Ustinov, Yu.A. Babanov, Yu.A. Salamatov, Institute of Metal Physics, RU
-Single Crystalline Micrometric Iron Oxide Particles with Superparamagnetic Behaviour for MRI Apllications
M.L. Kiss, M. Chirita, C.A. Beljung, R. Polanek, C. Savii, A. Ieta, A. Ionut Mihaila Chirita, State University of New York at Oswego, US
-Analysis of density waves in CdSe, SiC, and diamond nanocrystals by application of NanoPDF software package to experimental Pair Distribution Functions
S. Stelmakh, W. Palosz, S. Gierlotka, K. Skrobas, B. Palosz, Institute of High Pressure Physics PAS, PL
-Circular dichroism spectroscopy of Lysozyme-Silver Nanoparticles complex
S. Ashrafpour, T. Tohidi Moghadam, B. Ranjbar, Tarbiat Modares University, IR
-Nanostructure of Interfaces and Giant Magnetoresistance of Co/Cu Superlattices
S.A. Chuprakov, S.V. Verhovsky, T.P. Krinitsina, N.S. Bannikova, I.V. Blinov, M.A. Milyaev, V.V. Popov, V.V. Ustinov, Institute of Metal Physics, RU
-Investigation of the In2O3 oxide grown by electron beam on the In metal and on the InP(100)
K. Hamaida, M. Bouslama, M. Ghaffour, A. Ouerdane, Z. Lounis, A. Assaili, A. Nouri, F. Besahraoui, university of temouchent, DZ
-Highly Ordered Nanostructured Magnetite and Maghemite of Micrometric Sized and Rhombohedral Habit
M.L. Kiss, A. Ercuta, M. Chirita, C. Savii, A. Ieta, SUNY Oswego, US
-Fast and Facile Synthesis of Stable and Biocompatible Silver nanoparticles Stabilized by Polyethylene Glycol
S. Jain, S. Singh, S. Pillai, Alabama State University, US
-Non-contacting Residual Stress Measurement by Thermoelasticity
S.-J. Lin, Y.-C. Chou and H.-H. Li, National Kaohsiung University of Applied Sciences, TW

Tuesday June 17

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10:30The Importance of Characterization to Technology: KeynotesAzalea 2
Session chair: Dalia Yablon, SurfaceChar LLC (bio)
10:30Manufacturing: The 21st Century Nano Materials Challenge (invited presentation)
E.J. Amis, United Technologies Research Center, US (bio)
10:55Bimodal AFM for Elucidation of Polyolefin Morphology (invited presentation)
A.H. Tsou, D.G. Yablon, ExxonMobil Chemical Company, US (bio)
11:20The importance of Characterization to Technology (invited presentation)
G. Haugstad, University of Minnesota, US (bio)
11:45The importance of Characterization to Technology: Panel Discussion (invited presentation)
D. Yablon, SurfaceChar LLC, US (bio)
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Nanoscale Materials Characterization II - Posters 1:30Expo Hall C
-A New Separation Metric for the Optimization of AF4 Separations of Polydispersed Nanomaterials
A.A. Galyean, W.N. Vreeland, J.J. Filliben, R.D. Holbrook, H.S. Weinberg, University of North Carolina at Chapel Hill, US
-Carriers Transport in Quantum Dot Quantum Well Microstructures of Self-assembled CdTe/CdS/ligand Core-shell System
K. Li, Yanshan University, CN
-Synthesis and Characterization of Cadmium Substituted Copper Ferrite Nano- particles by Citrate Gel Method
Ch. Vinuthna, R. Madhusudan Raju, D. Ravinder, Organation, IN
-Microstructure and magnetic properties of nanosized Fe-Al-Sn alloy powders synthesized by mechanical alloying process
Z. Hamlati, H. Mechri, M. Azzaz, D. Martínez-Blanco, J.A. Blanco, P. Gorria, University of Saad Dahleb, DZ
-Characterization of Lignocellulose Nanomaterials to Discern Morphology Development During Mechanical Nanofibrillation
M.C. Branciforti, H-S. Yang, W.T.Y. Tze, University of Minnesota, US
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3:00Nanoscale Materials CharacterizationAzalea 2
Session chair: Greg Haugstad, Characterization Facility (CharFac), University of Minnesota (bio)
3:00Optical Spectroscopy Integrated with Environmental Scanning Transmission Electron Microscopy: a Comprehensive In Situ Characterization platform
M. Picher, S. Mazzucco, S. Blankenship, G. Holland, R. Sharma, National Institute of Standards and Technology, US
3:20Amplification of Surface Acoustic Waves in Graphene Film under DC Voltage
D.V. Roshchupkin, O.V. Kononenko, K. Tynyshtykbayev, Z. Insepov, Purdue University, US
3:40Nanoscale Chemical Imaging and Spectroscopy of Energy Nanomaterials by Scanning Transmission X-ray Microscopy
J. Wang, J. Zhou, Canadian Light Source Inc., CA
4:00The methodology and the software for the analysis of the atomic density modulation underneath the surface of a nanocrystal
S. Gierlotka, K. Skrobas, S. Stelmakh, W. Palosz, B. Palosz, Institute of High Pressure Physics PAS, PL

Wednesday June 18

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10:30Nanoscale Materials Characterization IINational Harbor 8
Session chair: Dalia Yablon, SurfaceChar LLC (bio)
10:30Cryogenic Temperature Nanoscopic Voltage Profiling of Operating Laser Devices
R.S. Dhar, D. Ban, University of Waterloo, CA
10:50Imaging and Spectroscopy of the Au Nanoclusters in the YSZ Films by Ballistic Electron/Hole Emission Microscopy
D.O. Filatov, D.V. Guseinov, I.A. Antonov, O.N. Gorshkov, A.I. Bobrov, D.A. Pavlov, N.I.Lobachevskii University of Nizhny Novgorod, RU
11:10Characterization of Core-Shell nanoparticles using Field-Flow Fractionation and Single-Particle ICP-MS
Soheyl Tadjiki, Manuel Montano, James Ranville and Ron Beckett, Postnova Analytics, US
11:30Moleular level (PFGNMR) study of rheology modifiers interactions to nanoparticles
K. Beshah, The DOW Chemical Co., US
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2:00Nanoscale Materials Characterization: VendorsNational Harbor 8
Session chair: Greg Haugstad, Characterization Facility (CharFac), University of Minnesota (bio)
2:00Size, shapes and superstructures of nanomaterials with a SAXS/WAXS instrument
S. Rodrigues, P. Panine, M.l Fernandez- Martinez, P. Høghøj, F. Bossan, R. Mahé, Xenocs SA, FR
2:20Single Particle ICP-MS (SP-ICP-MS) a New Analytical Technique for Counting and Sizing Metal Based Nanomaterials: Theory and Application
C. Stephan, PerkinElmer Inc, CA
2:40Multiangle dynamic light scattering for the improvement of multimodal and polydisperse particle size distribution measurements
A. Boualem, C. Ferre, M. Jabloun, A. Jalocha, M. Naiim, P. Ravier, CILAS, FR
3:00Developments Towards the Application of Raman Analysis in Carbon Nanotube Process Control
R.M. Stephenson, P.A. Anzalone, M.A. Banash, Nanocomp Technologies, Inc., US
3:20Nanomaterial Characterisation Challenges
P.G. Kippax, P.G. Clarke, C.C. Murphy, M. Kaszuba, Malvern Instruments Ltd, UK
3:40A TRIO of multi-technique nanoparticle characterization instruments, from smallest sample concentrations up to 40% v/v
D. Hagmeye, H. Wachernig, Microtrac, US
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Nanoscale Materials Characterization III - Posters 4:00Potomac Registration Hall
-Silver nanospheres and silver nanotriangles reducing Candida albicans in dental devices
G. Hernàndez-Padròn, T. Gòmez-Quintero, L.M. Lòpez-Marìn, V. Castaño, M.C. Arenas, J. de la Fuente-Hernàndez, L.S. Acosta-Torres, Centro de Fìsica Aplicada y Tecnologìa Avanzada, UNAM, MX
-Assessing the pore network of hierarchical micro/mesoporous materials
F. Villemot, A. Galarneau, J. Rodriguez, F. Di Renzo, F. Fajula, B. Coasne, Institut Charles Gerhardt, FR
-PEGylated Gold Nanorods: A development for the separation and characterization of biocompatible nanoparticles
T.M. Nguyen, J.C. Gigault, V.A. Hackley, National Institute of Science and Technology, US
-Magneto-optic Response of Iron Oxide Nanoparticles under Pulsed and AC Fields
M. Syed, T. Foulkes, Rose-Hulman Institute of Technology, US
-Acrylated Block Copolymers for Mocuadhesive Micellar Delivery of Hydrophobic Drugs
T. Eshel-Green, H. Bianco-Peled, The Technion – Israel Institute of Technology, IL
-Counting and Sizing Nanoparticles using Single Particle ICP-MS
C. Stephan, A. Hineman, PerkinElmer Inc, CA
-Single Particle ICP-MS (SP-ICP-MS) for the Detection of Metal-Based Nanoparticles in the Environment
A. Hineman, C. Stephan, PerkinElmer Inc, CA
-Use of Single Particle Inductively Coupled Plasma Mass Spectrometry to Characterize a New Silver Nanoparticle Reference Material
K.E. Murphy, J. Liu, W.F. Guthrie, J.M. Gorham, J.E. Bonevich, A.J. Allen, M.R. Winchester, V.A. Hackley, R.I. MacCuspie, National Institute of Standards and Technology, US
-A New Biocomposite Electrode Sensor for the Detection of Oxidative Reactions
D. Assan, X. Gao, J.C.K. Lai, S.W. Leung, Idaho State University, US
-Converting Dimensions: A Facile and High-Yield Route for Getting Sub-100 nm Silicon Nanowires
S.H. Lee, Yonsei University, KR
-First-Order-Reversal-Curve Analysis of Nanoscale Magnetic Materials
B.C. Dodrill, L. Spinu, Lake Shore Cryotronics, US
-Synthesis and characterization of ZnO:Tm3+ based phosphor nanocrystals
G.L. Kabongo, G.H. Mhlongo, B.M. Mothudi, K.T. Hillie, M.S. Dhlamini, University of South Africa, ZA
-Revolution Fibres – Turning Nanofibre into Products
I. Hosie, K.K.G. De Silva, University of Auckland - Product Accelerator, NZ
-The Influence of Surface Nanoroughness, Texture and Chemistry of TiZr Implant Abutment on Oral Biofilm Accumulation
R. Xing, S.P. Lyngstadaas, J.E. Ellingsen, H.J. Haugen, University of Oslo, NO

Most technological research includes advanced characterization at the nanoscale. This event promotes the rapid education, dissemination, and commercialization of new characterization techniques into industries based in both physical and life sciences. It seeks to introduce general technique types to newcomers, report pioneering methods, and drill down into new physical understandings, all the while addressing applications useful to industrial engineers and technicians.

Advances in characterization include not only far-field probes (e.g., beams of electrons, ions, neutrons or photons) and near-field probes (indentors, nanotips, fibers and nanotubes), but also a growing intellectual component whereby data are manipulated, analyzed, rendered and simulated to yield meaningful information. As some tools and methods have become more common and practical, certain misunderstandings and misinterpretations also have crept into the lexicon. Besides an element of “methods training” to promote the insightful application of characterization tools in nanotechnology R&D, this symposium will emphasize projects utilizing a spectrum of complementary techniques.

In 2014, this symposium will feature a special session on “the importance of characterization to technology”. The purpose of this session is to engage stakeholders at every stage in the course of technology development so that they can know and ultimately understand the value and limitations of nanoscale characterization. This will include discussion of devices and industries using nanoscale characterization, nanoscale materials and properties central to technology, failure analysis, scale up issues, product testing, testing standards, among others.

Topics & Application Areas

  • Real space imaging and mapping
  • Ensemble methods (scattering, spectroscopy)
  • Multi-technique characterization of nanostructured materials
  • Multi-technique characterization of nanoscale phenomena
  • Special session on nanoparticle sizing and counting
  • Other

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