NanoScale Materials Characterization With Impact at the Industrial Scale

William A. Lamberti

William A. Lamberti

Researcher

Exxon-Mobil

Bill received his B.S. degree in physics from St. John’s University and M.Eng. in Materials Science and Engineering from Lehigh University.

Bill joined the Corporate Research Laboratory at Exxon Research and Engineering in 1987 to work in the area of Secondary Ion Mass Spectrometry and Electron Microscopy. Prior to Exxon, Bill worked as a visiting researcher at Oak Ridge National Laboratory where he studied ion source design and hyperfine laser spectroscopy. He also has worked as an accelerator physicist at the SUNY Stony Brook Nuclear Structure Laboratory. Bill has advanced and applied ion, electron, and optical microscopies for ExxonMobil across a wide range of areas. His research areas include spatially-resolved geochemical measurements for reservoir characterization, high strength alloys for gas transport, catalyst-product studies, diesel exhaust emission reduction, supported catalyst characterization, and the development of novel materials characterization techniques. He is a contributing author to the “Handbook of Microscopy for NanoTechnology” published by Kluwer Academic Publishers (USA) and Tsinghua University (China). Bill currently leads a physics-based program on reactor reliability and supervises the SIMS, SEM, and Optical Microscopy Area of the Advanced Characterization Section of EMRE Corporate Strategic Research. He holds several patents related to his work. Bill is active with science-based community outreach activities in local schools, and the Boy Scouts of America.

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