Magnetic Resonance Force Microscopy using a Commercially Available SPM Unit

S. Won, J. Heo
Korea Institute of Materials Science, KR

Keywords: MRFM, force detection, magnetic resonance, SPM, electron spin resonance


Magnetic resonance force microscopy (MRFM) is considered another as a novel scanning probe microscope (SPM) combined with conventional SPM and magnetic resonance imaging. Originally, MRFM is proposed as a means to improve detection sensitivity to the single-proton level. However, MRFM has not become a commercialized technology up to now, in contrast with atomic force microscope (AFM). All MRFMs working currently, including our MRFM, are home-made systems manufactured in unique ways. Therefore, there is still room for improvement in each of the components making up an MRFM device, and this kind of improvement is a very important right now, necessary for true application of this device in the field of nanotechnology. Also, assigning reliability to hardware is very important in the process of development of new technology. In this study, we propose a MRFM using a commercially available SPM unit. Also, we introduce a module for correcting the optical fiber-to-cantilever alignment.