Predicting Device Performance with Statistically Relevant Conducting Atomic Force Microscopy (C-­‐AFM)

Kumar  Virwani

Kumar Virwani

Research Scientist, Materials Analysis and Characterization

IBM Research - Almaden

Kumar Virwani is a Research Scientist at the IBM Almaden Research Center in San Jose, California. He obtained Bachelor in Engineering (BE) degree from the University of Mumbai, India and MS and Ph.D. degrees from the University of Arkansas in Fayetteville, USA. He worked at Burker Nano From Oct 2006 to Sep 2008 on various aspects of scanning probe microscopy. In Sep 2008, he joined IBM Research Center in the Almaden Valley. His research activities include advanced techniques (electrical, magnetic, mechanical and fluid) with scanning probe microscopy, mixed ionic electronic conductors, non-­‐volatile memory materials, nanoindentation of low-­‐k dielectric materials and Auger spectroscopy.

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