Mapping nanoscale elastic and viscoelastic properties with contact resonance force microscopy | |
| Donna HurleyStaff Physicist, Material Measurement LabNational Institute of Standards & Technology (NIST) |
Donna Hurley is a staff physicist in the Material Measurement Laboratory at the National Institute of Standards & Technology (NIST). Her project team develops measurement technology and instrumentation for quantative imaging of nanomechanical properties with the atomic force microscope (AFM). Current activities include developing AFM-based tools for viscoelastic and thermomechanical properties of polymers. Prior to NIST, she worked at GE Corporate Research (now GE Global R & D) in Schenectady, NY and was a NATO-NSF Postdoctoral Fellow at the University of Nottingham (UK). She has a Ph.D. in Condensed Matter Physics from the University of Illinois at Champaign-Urbana.
