Impact of Nanoscale Dimensions on Optical Properties
Alain C. Diebold
University of Albany
Dr. Alain Diebold is an Empire Innovation Professor of Nanoscale Science at the College of Nanoscale Science and Engineering (CNSE) of the University at Albany, as well as the Executive Director of CNSE’s Center for Nanoscale Metrology. He is also Executive Director of the New York Center for National Competitiveness in Nanoscale Characterization. His research focuses on the impact of nanoscale dimensions on the physical properties of materials; he also continues to work in the area of nanoelectronics metrology. He is a member of the International Metrology Technical Working Group, founder and co-chair of the U.S. Metrology Technical Working Group for the 2010 International Technology Roadmap for Semiconductors, and chair of the Manufacturing Science and Technology Group of the American Vacuum Society. Previously, Dr. Diebold was a SEMATECH Senior Fellow, with the main focus of his activities involving metrology industry coordination. He has edited the Handbook of Silicon Semiconductor Metrology, published in June 2001; is a panel member for the Metrology section of Future Fab International; and, he has co-edited three books that are conference proceedings from Characterization and Metrology for ULSI Technology and its predecessor conference. He also worked at Allied Signal in the areas of molecular beam epitaxy of III-V compounds and materials characterization of a broad range of semiconductor and amorphous metal products.