Simultaneous nanoscale chemical and mechanical property characterization at variable temperatures using AFM-IR spectroscopy
Kevin Kjoller is currently Vice President at Anasys Instruments. In 2005, he co-founded a new instrumentation company, Anasys Instruments, focused on adding new analytical capabilities to Scanning Probe Microscopes. At Anasys, his main responsibility has been the development of new products and applications. He has led the development of the award winning NanoTA2 and VESTA thermal analysis products as well as the recently introduced nanoIR, nanoscale infrared spectroscopy system. Prior to Anasys, he joined Digital Instruments in 1987 and held a variety of positions including Director of Applications and Director of Engineering there and at Veeco Instruments. In these positions, he was responsible for the development of a number of SPM techniques and products. Mr. Kjoller graduated from UCSB with a BS degree in Physics.