Nanotech 2010
Lucille Giannuzzi

Lucille Giannuzzi


Lucille Giannuzzi is currently a Product Marketing Engineer for FIB and DualBeamTM instruments at FEI Company. She has been with FEI over 7 years. She holds a B.E. in Engineering Science and an M.S. in Materials Science and Engineering from SUNY Stony Brook. She received her Ph.D. from The Pennsylvania State University in Metals Science and Engineering. Prior to joining FEI, Lucille was founding Director of the Materials Characterization Facility at the University of Central Florida and Professor of Mechanical Materials & Aerospace Engineering where her primary research interests included and continue to be ion/solid interactions, applications and techniques using FIB/DualBeamTM instruments, and the microstructural evaluation of materials using focused ion beams and electron microscopy. She maintains professional affiliations in AVS, ACerS, ASM Intl., TMS, MRS, MSA, and MAS. She has been on the editorial board of the journal Microscopy and Microanalysis, and on the board of the Microbeam Analysis Society. She is currently past-Chair of the Applied Surface Science Division of AVS and a Fellow of AVS. Lucille has over 100 authored/co-authored publications and is co-editor of a book entitled “Introduction to Focused Ion Beams.”
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