Senior Application Scientist
Dr. Sergei Magonov was educated in the former USSR where he got his PhD and has conducted research on polymers in the RussianAcademy of Sciences. In 1988 Dr. Magonov moved to Germany (Freiburg University) where he started to apply first scanning tunneling microscopy (STM) and later atomic force microscopy (AFM) to different materials. The scientific results obtained in this period were summarized in the book (written jointly with Prof. M. Whangbo) “Surface Analysis with STM and AFM”, VCH Weinheim 1996. In 1995 Sergei joined Digital Instruments – the leading manufacturer of the scanning probe microscopes where he was involved in development of various AFM applications to soft materials. After spending 12 years with Digital Instruments/Veeco Instruments he moved in 2007 to Agilent Technologies – another manufacturer of scanning probe microscopy, where he is continuing research in AFM. He is the author of 13 chapters/reviews and 175 per-review papers.