Thin-Film Morphology and Structure Analysis by GISAXS with Home-Laboratory Instrumentation
Markus Weygand is application scientist at Hecus X-Ray Systems, Graz, Austria. His field of experience are structural studies of soft matter liquid interfaces with neutron and X-ray scattering techniques. He obtained his physics diploma from the University of Karlsruhe, Germany, made his doctoral thesis in physics at the University of Leipzig, then joined the Nano Science Center, Copenhagen University, Denmark and the Max-Planck Institute for Colloids and Surfaces, Potsdam (Golm), Germany as postdoc. From 2006 till 2009 he was a special faculty member in the physics department in the Carnegie Mellon University.