Reinhard Pufall Infineon Technology AG

Reinhard Pufall received the PhD in physics from the University Bayreuth in 1986. He joined the Siemens Research Centre in 1986. He has worked in different fields as automated design and 2D and 3D full chip simulation for DRAMs in Infineon business group Memory Products.

He is an expert for interconnect and assembly technologies. He is currently responsible for reliability modelling, accelerated testing and lifetime prediction for automotive power components in the Infineon reliability department. He is a founder member of EUCEMAN (European Center for Micro- and Nanoreliability), Member of the international advisory board of the Micromaterials and Nanomaterials and member of the editorial board of the Microsystem Technologies.

In the last 5 years he has published more than 15 scientific papers as author and co-author.

Speaking in the special symposium on Micro & Nano Reliability.