Nanotech 2010

Development of Quantitative Adhesive Force Measurement Systems for Flexible Electronics

M. Kim, J. Park, B. Choi
Sogang University, KR

Keywords: adhesive force

Abstract:

In this paper, a novel adhesive force measurement system is developed to measure adhesive forces from interacting surfaces. In previous paper, the adhesive force was measured with tens/hundreds of uN, and the displacement was measured with tens of nm resolution. Here, we used a high resolution force sensor and a high resolution z-stage to increase sensitivity in adhesive force measurement with under a few uN and tens of nm resolution. The force measurement part is fixed on a uniformly drilling plate, which assembled manual z-stage, piezo z-stage, and force sensor. Using the force sensor in the adhesive force measurement system, a pull-off force of an adhesive layer is measured. At this time, we measured multiple sections of the 300 mm width film. Database, that is the measured pull-off force of each adhesive layer was created.
 
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