Nanotech 2010

Characterization of Nanoscale Organic Pigments by Electron Microscopy Techniques

P. Li, M. Malac, F. Paraguay-Delgado, R. Carlini, S. Gardner
Xerox Research Centre of Canada, CA

Keywords: TEM, electron tomography, organic nanopigment, nanocomposite, radiation damage


Development of high performance nanostructured materials requires detailed understanding about the morphology and internal structure of such materials, which can include components such as colorants and specialty additives. Electron microscopy offers suitable techniques for characterizing the particle dimensions, 3D morphology and crystal substructure of ‘soft’ nanoscale organic pigments provided that care is taken to prevent electron irradiation damage. We describe the application of several electron microscopy methods, including high-resolution TEM (HRTEM), electron diffraction, thickness mapping by energy-filtered TEM (EFTEM), and Electron Tomography (ET), for characterizing nanoscale quinacridone pigments [1] and monoazo laked pigments [2]. Comparisons of the dimensions and morphological data between nanopigments and larger commercial pigments were made, where possible.
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