Nanotech 2010

Monte Carlo Modeling Of Electrical Breakdown In Layered Capacitors

E. Furman, G. Sethi, B. Koch, M. Lanagan
Pennsylvania State University, US

Keywords: dielectric breakdown, layered composite, tree propagation, reliability

Abstract:

In the last several years our group at Penn State performed Monte Carlo modeling and experiments directed towards improved understanding of layered organic/inorganic composites. We have adopted Monte Carlo method to study dielectric breakdown of layered composites in a divergent field. Our modeling results are in agreement with experiments indicating that improved reliability of dielectrics is achievable by using layered structure. Both dielectric contrast and location of layers are important in determining dielectric reliability.
 
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