Nanotech 2010

Characterization of an electrical powering nano-generator based on aluminum doped ZnO thin films

N. Muñoz Aguirre, J.E. Rivera López, L. Martínez Pérez, P. Tamayo Meza
Instituto Politecnico Nacional, MX

Keywords: piezoelectric ZnO thin films, atomic force microscopy, c-AFM, nano-generator


Conductive Atomic Force Microscopy (c-AFM) [1][2] characterization was made on Aluminum doped ZnO thin films. Furthermore, to the electrical resistance associated to the surface of the film, was in series connected a load resistance as shown in Figure 1. With no voltage applied to the AFM tip, a voltage throughout the load resistance only generated by the atomic force tip-sample interaction, while the scanning is taking place [3], was measured and shown in Figure 2.
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