Predicting Contrast in Dynamimc Atomic Force Microscopy of Polymeric Systems

Greg  Meyers

Greg Meyers

Group Leader

Dow Chemical Company

Gregory F. Meyers, Ph.D is the group leader for AFM within Corporate R&D at the Dow Chemical Company. He oversees Dow\'s global AFM capability that includes five sites and is widely accepted as a thought leader within the global AFM community. In 1996 he was the recipient of Dow\'s Vernon Stenger award for Excellence in Analytical Science in 2000 and was awarded the Michigan Scientists Organization Scientist\'s Award in 2002 for excellence in the development and application of SPM technologies. Greg is a co-principal investigator along with Dr. Craig Prater of Veeco Instruments, Inc. on a 3year, $13MM joint NIST ATP project to develop quantitative nanomechanical measurements based on an atomic force microscopy platform. He is the author or co-author of 35 publications and 1 patent. He obtained a BA degree in chemistry from Bowdoin College in 1979 and a PhD degree in inorganic chemistry from Texas A&M University in 1985.

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