2010 Workshop on

Compact Modeling

June 21 - 25, 2010
Anaheim Convention Center
Anaheim, California, U.S.A.

Late News Abstracts Due: March 19^th (POSTER Presentation Only)

Workshop Chair

Xing Zhou Professor Nanyang Technological University, Singapore

Synopsis

Compact Models (CMs) for circuit simulation have been at the heart of CAD tools for circuit design over the past decades, and are playing an ever increasingly important role in the nanometer system-on-chip (SOC) era.  As the mainstream MOS technology is scaled into the nanometer regime, development of a truly physical and predictive compact model for circuit simulation that covers geometry, bias, temperature, DC, AC, RF, and noise characteristics becomes a major challenge.

Workshop on Compact Modeling (WCM) is one of the first of its kind in bringing people in the CM field together. The objective of WCM is to create a truly open forum for discussion among experts in the field as well as feedback from technology developers, circuit designers, and CAD tool vendors. The topics cover all important aspects of compact model development and deployment, within the main theme - compact models for circuit simulation, which are largely categorized into the following groups:

• Intrinsic Models
  • Bulk MOSFET
  • SOI MOSFET (partial-/full-depletion)
  • Multiple-Gate FET (DG/TG/GAA)
  • High-Voltage/LDMOS
  • Thin-Film Transistor (TFT)
  • Schottky-Barrier/Tunneling FET (SB-FET/TFET)
  • Bipolar/Junction (BJT/HBT/SiGe/JFET)
  • RF/noise
• Extrinsic/Interconnect Models
  • Parasitic elements
  • Passive device
  • Diode
  • Resistor
  • ESD
  • Interconnect
• Atomic/Quantum Models
  • Ballistic device
  • Carbon-Nanotube (CNFET)
  • Organic FET
• Statistical Models
  • Statistical/variability
  • Reliability/hot carrier
  • Numerical/TCAD/table-based
• Multi-Level Models
  • Subcircuit model
  • Gate/block model
  • Behavioral model
• Model Extraction and Interface
  • Parameter extraction and optimization
  • Model-simulator interface
  • Model standardization

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Journal Submissions

Microelectronics Journal

Published since 1969, Microelectronics Journal is an international forum for the dissemination of research into, and applications of, microelectronics. Papers published in Microelectronics Journal have undergone peer review to ensure originality, relevance and timeliness. The journal thus provides a worldwide, regular and comprehensive update on microelectronics.

For consideration into the Microelectronics Journal please select the “Submit to Microelectronics Journal” button during the on-line submission procedure.

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