Microtech2010 2010

Characterization of c-Si, Thin Film a-Si, and CIGS Solar Materials using SIMS, TOF-SIMS, TEM, Auger and GDMS

G. Mount, R. Michel, U. Sharma, J. Moskito, K. Putyera, L. Wang, T. Buyuklimanli
Evans Analytical Group, US

Keywords: CIGS, c-Si, a-Si, characterization, analysis, investigation


Materials characterization laboratories have been very active in characterizing solar materials for structure, composition, dopants and contaminants. In this presentation we will report on our activities in c-Si, a-Si and CIGS technologies. We have had many requests for measurements that will show why one cell has high conversion efficiency while another cell that should be the same has low conversion efficiency. We investigate these cases using a number of analytical approaches to reveal differences between cells to help explain performance issues. Understanding these issues are key to improved efficiency
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