Microtech2010 2010

AFM Method for Fast Mapping of Materials Properties

Organization:University of Minnesota, MN, US
I.P. Brief:A simple AFM (Atomic Force Microscopy) cantilever excitation method provides real-time estimation of equivalent resonant frequency and quality factor during tapping mode operation. The technique is 100 times faster than current methods and has a topography resolution < 1 nm.
Keywords:Atomic force microscopy, AFM, scanning probe microscopy,Atomic force microscopy, AFM, scanning probe microscopy, SPM, cantilever, imaging, excitation, cantilever excitation
Primary Industry:Instrumentation

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