Microtech2010 2010

ScanAsyst and Peak Force QNM: Designed for Scientific Productivity, Atomic Force Microscope, Scanning Probe Microscope, SPM

S.C. Minne
Veeco Instruments, US

Keywords: AFM, imaging, imaging control, automated, sample surface

Abstract:

Atomic Force Microscopy has enabled numerous scientific advances through the nanomechanical interrogation of sample surfaces, however contrary to its name; the Tapping Mode Atomic Force Microscope (AFM) does not actually measure the unique individual direct force interactions between the tip and the sample. The recently introduced Peak Force QNM™, from Veeco, overcomes this limitation by implementing a non-resonant imaging technique to directly capture real-time force curves at speeds and forces previously unobtainable: >100pN (10x lower than TappingMode at equivalent speeds). Being able to directly measure this force interaction reveals new information in nanomechanical property images, as well as, new surface information through the separation of near and far field force interactions. Additionally, the by removing the resonant dynamics from the imaging control loop, great improvements have be demonstrated in fundamental aspects of imaging control and automated operation. Data on polymers, biological samples, and liquid crystal surfaces are presented to demonstrate these capabilities.
 
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