Nanoscale electromagnetic characterization of semiconductors and photovoltaics with scanning microwave microscopy

T. Mitch Wallis

T. Mitch Wallis

Physicist, Electromagnetics Division

National Institute of Standards and Technology

T. Mitch Wallis received his B.S. degree in physics from the Georgia Institute of Technology in 1996 and his M.S. and Ph. D. degrees in physics from Cornell University in 2000 and 2003, respectively. His PhD work focused on the manipulation and characterization of individual atoms and molecules with a scanning tunneling microscope. In 2003, he was awarded a National Research Council postdoctoral fellowship at the National Institute of Standards and Technology (NIST) in Boulder, Colorado. From 2005 to 2007, he held a postdoctoral appointment at Colorado State University. His postdoctoral research focused on the development of metrology for magnetic field imaging based on bi-material cantilevers as well as cantilever-based measurement of magnetomechanical phenomena such as the Einstein-de Haas effect. Since 2007, he has held a position as a physicist at NIST. His current research interests include the development of high-frequency scanning probe microscopes, broadband electrical measurements, and other metrology to enable advances in RF nano-electronics, “beyond-CMOS” devices, and photovoltaics.

Sponsor & Exhibitor Opportunities

 Exhibit and Showcase
 Become a Sponsor

Please contact: Chris Erb


TechConnect Acceleration Partners:

BASF
BayerMaterialScience
Battelle
Bosch
bp
DOW
GE
Honda
Hyundai
Ingersoll Rand
intel
Lockheed Martin
MWV
Merck
novaris
Panasonic
Procter And Gamble
PPG
Roche
Sanofi
Shell_GameChanger
siemens
solvay
Toyota.gif

In Partnership with

CTSI


Sponsorship Opportunities: Contact Chris Erb

Free Subscription

E-mail:

pbh(); ?>